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DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM 実績あり

外国特許コード F080001985
整理番号 F080001985
掲載日 2008年12月5日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP070738
国際公開番号 WO 2008/056541
国際出願日 平成19年10月24日(2007.10.24)
国際公開日 平成20年5月15日(2008.5.15)
優先権データ
  • 特願2006-301012 (2006.11.6) JP
発明の名称 (英語) DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM 実績あり
発明の概要(英語) A diagnostic device providing a favorable diagnosis result by further improving the diagnosis resolution. A diagnostic device (1) has a symbol inserting section (3) which is composed of an active element symbol inserting sub-section (5) and a passive element symbol inserting sub-section (7), an occurrence probability imparting section (9), and equivalent occurrence probability imparting section (11), and a switching section (13). A per-test X failure diagnosis flow by the diagnostic device (1) is structured by a failure information collection stage and a diagnosis conclusion stage. The layout of a deep submicron LSI circuit frequently needs multilayer interconnection and information on vias to be widely used is used. Therefore, the passive element symbol inserting sub-section (7) can indicate defective portions at the via level, and the diagnosis resolution is significantly improved. The occurrence probability imparting section (9) uses a new diagnosis value and takes the occurrence probability of a logical combination of possible failures which may occur into consideration. As a result, the actual operation of a deep submicron LSI circuit is well reflected, and is useful for improvement of the diagnosis resolution.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Japan Science and Technology Agency
  • Kyushu Institute of Technology
  • System JD Co., Ltd.
  • 発明者(英語)
  • WEN, Xiaoqing
  • KAJIHARA, Seiji
  • MIYASE, Kohei
  • MINAMOTO, Yoshihiro
  • DATE, Hiroshi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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