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GENERATION DEVICE, GENERATION METHOD, PROGRAM AND RECORDING MEDIUM 実績あり

外国特許コード F080001986
整理番号 F080001986
掲載日 2008年12月5日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP068505
国際公開番号 WO 2008/041537
国際出願日 平成19年9月25日(2007.9.25)
国際公開日 平成20年4月10日(2008.4.10)
優先権データ
  • 特願2006-262764 (2006.9.27) JP
発明の名称 (英語) GENERATION DEVICE, GENERATION METHOD, PROGRAM AND RECORDING MEDIUM 実績あり
発明の概要(英語) A generation device and the like are provided for generating a test vector which can efficiently reduce power consumption at the time of capture. A generation device (100) is comprised of a selection unit (101) which allocates logic values to a plurality of unfixed value bits included in a test cube for a logic circuit to generate a test vector and selects an allocation subject unfixed value bit from a plurality of the unfixed value bits, a capture transition digitizing unit (103) for calculating the number of capture transitions by the test cube including the unfixed value bits, and a logic value allocation unit (105) which applying a first test cube allocating a logic 0 to the selected allocation subject unfixed value bits and a second test cube allocating a logic 1 to the capture transition digitizing unit (103), compares the number of capture transitions in accordance with the first test cube and that in accordance with the second test cube, and allocates a logic value corresponding to the less number of the capture transitions of either the first or second test cube to the selected allocation subject unfixed value bits.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Japan Science and Technology Agency
  • Kyushu Institute of Technology
  • System JD Co., Ltd.
  • 発明者(英語)
  • WEN, Xiaoqing
  • KAJIHARA, Seiji
  • MIYASE, Kohei
  • MINAMOTO, Yoshihiro
  • DATE, Hiroshi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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