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DOUBLE REFRACTION MEASURING EQUIPMENT AND DOUBLE REFRACTION MEASURING METHOD 実績あり

外国特許コード F090002064
整理番号 F090002064
掲載日 2009年4月17日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP062019
国際公開番号 WO 2008/026363
国際出願日 平成19年6月14日(2007.6.14)
国際公開日 平成20年3月6日(2008.3.6)
優先権データ
  • 特願2006-232380 (2006.8.29) JP
発明の名称 (英語) DOUBLE REFRACTION MEASURING EQUIPMENT AND DOUBLE REFRACTION MEASURING METHOD 実績あり
発明の概要(英語) Double refraction measuring equipment requiring only three pieces of light intensity information and can measure the double refraction characteristics of a measured object through a relatively inexpensive arrangement of equipment. The double refraction measuring equipment is characterized by comprising a light source (1) emitting a light beam having a specific polarization state to the measured object, an optical system for extracting light beams in three predetermined polarization directions, respectively, for a light beam passed through the measured object, a quantity of light detection means (9) for detecting the quantities of light of the light beams in three predetermined polarization directions extracted by the optical system, respectively, and a double refraction amount calculation means (20) for calculating the magnitude and the azimuth of double refraction of the measured object by substituting the quantities of light of light beams detected by the quantity of light detection means into a predetermined function expression.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Tokyo Denki University
  • 発明者(英語)
  • Gomi, Kenji
国際特許分類(IPC)
指定国 AE AG AL AM AT AU AZ BA BB BE BF BG BH BJ BR BW BY BZ CA CF CG CH CI CM CN CO CR CU CY CZ DE DK DM DO DZ EC EE EG ES FI FR GA GB GD GE GH GM GN GQ GR GT GW HN HR HU ID IE IL IN IS IT JP KE KG KM KN KP KR KZ LA LC LK LR LS LT LU LV LY MA MC MD MG MK ML MN MR MT MW MX MY MZ NA NE NG NI NL NO NZ OM PG PH PL PT RO RS RU SC SD SE SG SI SK SL SM SN SV SY SZ TD TG TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
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