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SURFACE CONTAMINATION EXAMINING DEVICE AND METHOD

外国特許コード F090002149
整理番号 F090002149
掲載日 2009年12月18日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP057184
国際公開番号 WO 2008/047487
国際出願日 平成19年3月30日(2007.3.30)
国際公開日 平成20年4月24日(2008.4.24)
優先権データ
  • 特願2006-282182 (2006.10.17) JP
発明の名称 (英語) SURFACE CONTAMINATION EXAMINING DEVICE AND METHOD
発明の概要(英語) A surface contamination examining device comprises a radiation sensor (11) and a computing/displaying device (13) for displaying the counting rate indicating the radiation strength. The computing/displaying unit has a boundary detecting device (10) for detecting the boundary of the contamination (14) of the object to be measured by a radioactive substance while the radiation sensor is moved along the surface (18) of an object to be measured. The boundary detecting device (10) includes counting rate storage means for storing the counting rate Yi at a constant time interval sequentially, slope computing means for computing the slopes aM, aN of the approximation lines from the immediately previous M counting rates Yi including the final counting rate YM (M is an integer of 3 or larger) and the immediately previousN counting rates Yi (N is an integer smaller than M) including the final counting rate YM, and boundary judging means for judging the boundary of the contamination of the object to be measured by a radioactive substance on the basis of the slopes aM, aN of the lines.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National Institute of Radiological Sciences
  • 発明者(英語)
  • SHIRAKAWA, Yoshiyuki
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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