TOP > 外国特許検索 > IONIZATION METHOD, AND MASS-SPECTROSCOPIC METHOD AND APPARATUS UTILIZING THE IONIZATION METHOD

IONIZATION METHOD, AND MASS-SPECTROSCOPIC METHOD AND APPARATUS UTILIZING THE IONIZATION METHOD

外国特許コード F090002174
整理番号 F090002174
掲載日 2010年3月5日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2008JP071991
国際公開番号 WO 2009/069816
国際出願日 平成20年11月27日(2008.11.27)
国際公開日 平成21年6月4日(2009.6.4)
優先権データ
  • 特願2007-311322 (2007.11.30) JP
発明の名称 (英語) IONIZATION METHOD, AND MASS-SPECTROSCOPIC METHOD AND APPARATUS UTILIZING THE IONIZATION METHOD
発明の概要(英語) Provided is an ionizing method for ionizing the molecules of an extremely fine portion of a specimen. This ionizing method can image with a space resolving power of a nano-meter order. An object specimen (containing a specimen having a suitable matrix applied thinly thereto or mixed with the matrix) is exemplified by living tissues, cells, or organic materials. The specimen is applied to a substrate, and is evaporated on its surface with a thin film of gold of an nm order (or 10 nm, for example). The thin film of gold is irradiated with a double wave of a YAG laser of a wavelength of 532 nm so that it has a hole of an nm order. At the instant when the hole is formed, the thin gold film is further irradiated with the laser beam by lowering the beam output. The ions, which are generated from the holed region, are guided into a mass spectrometer so that they are subjected to a mass spectroscopy. By sweeping the specimen substrate or the laser beam, the molecule imaging image of the living specimen or the like can be formed in the nm order.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • UNIVERSITY OF YAMANASHI
  • 発明者(英語)
  • HORI, Hirokazu
  • CHEN, Lee Chuin
  • HIRAOKA, Kenzo
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
上記の特許・技術に関心のある方は、下記問合せ先にご相談下さい。

PAGE TOP

close
close
close
close
close
close