TOP > 外国特許検索 > METHOD AND MARKER FOR DETERMINATION OF DEGREE OF RISK OF ONSET OF HIGH-FUNCTIONING AUTISM

METHOD AND MARKER FOR DETERMINATION OF DEGREE OF RISK OF ONSET OF HIGH-FUNCTIONING AUTISM コモンズ

外国特許コード F100002305
整理番号 0910
掲載日 2010年11月30日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2010JP006114
国際公開番号 WO 2011/045937
国際出願日 平成22年10月14日(2010.10.14)
国際公開日 平成23年4月21日(2011.4.21)
優先権データ
  • 特願2009-236976 (2009.10.14) JP
発明の名称 (英語) METHOD AND MARKER FOR DETERMINATION OF DEGREE OF RISK OF ONSET OF HIGH-FUNCTIONING AUTISM コモンズ
発明の概要(英語) Disclosed are: an objective and simple method for determining the degree of risk of onset of autism using a biological marker; and the provision of a proper therapy to an autism patient in an early stage by finding the autism patient in an early stage using the method. Specifically disclosed are: a method for determining the degree of risk of onset of autism, which comprises a step of measuring the concentration of a neutral fat or cholesterol contained in a very low density lipoprotein fraction of plasma or serum isolated from a subject or the concentration of a neutral fat or cholesterol in the plasma or serum; a kit for determining the degree of risk of onset of autism, which utilizes the method; and a method for screening for a candidate substance for a therapeutic agent for autism, which utilizes a non-human mammal.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National University Corporation Hamamatsu University School of Medicine
  • 発明者(英語)
  • MORI, Norio
  • NAKAMURA, Kazuhiko
  • SUZUKI, Katsuaki
  • TSUCHIYA, Kenji
  • IWATA, Keiko
  • MATSUZAKI, Hideo
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
特許の内容に興味を持たれた方、ライセンスをご希望の方は、下記「問合せ先」までお問い合わせください。

PAGE TOP

close
close
close
close
close
close