TOP > 外国特許検索 > QUANTITATIVE EVALUATION METHOD AND DEVICE FOR ZETA POTENTIAL, pH OR TEMPERATURE DISTRIBUTION AT WALL SURFACE, AND QUANTITATIVE VISUALIZATION METHOD AND DEVICE FOR SURFACE MODIFICATION

QUANTITATIVE EVALUATION METHOD AND DEVICE FOR ZETA POTENTIAL, pH OR TEMPERATURE DISTRIBUTION AT WALL SURFACE, AND QUANTITATIVE VISUALIZATION METHOD AND DEVICE FOR SURFACE MODIFICATION コモンズ

外国特許コード F100002322
掲載日 2010年12月9日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP066652
国際公開番号 WO 2010/041560
国際出願日 平成21年9月25日(2009.9.25)
国際公開日 平成22年4月15日(2010.4.15)
優先権データ
  • 特願2008-263639 (2008.10.10) JP
発明の名称 (英語) QUANTITATIVE EVALUATION METHOD AND DEVICE FOR ZETA POTENTIAL, pH OR TEMPERATURE DISTRIBUTION AT WALL SURFACE, AND QUANTITATIVE VISUALIZATION METHOD AND DEVICE FOR SURFACE MODIFICATION コモンズ
発明の概要(英語) Multiple fluorescent dyes having different amounts of charge or charge characteristics and different fluorescent wavelengths are mixed into a solution, and the solution is allowed to flow over a surface to be measured. The fluorescent intensity distribution of multiple colors corresponding to the concentration distribution of the individual fluorescent dyes is produced by exciting the surface to be measured using an evanescent wave. The ratio of the fluorescent intensities of the multiple colors is calculated by measuring the fluorescent intensity at the surface to be measured using a two-dimensional imaging element that can be obtained by separating the intensities of the multiple fluorescent colors by color, and the ratio is converted into the two-dimensional distribution of zeta potential, pH or temperature at the wall surface using a relational expression, which has been formulated beforehand, between the ratio of the fluorescent intensities and the zeta potential, pH or temperature at the wall surface. Thus, surface modification or the two [NON-BREAKING HYPHEN] dimensional distribution of zeta potential, pH or temperature at the wall surface can be visualized in real time, and can also be evaluated quantitatively.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Keio University
  • 発明者(英語)
  • SATO, Yohei
  • KAZOE, Yutaka
  • MIYAKAWA, Shu
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
参考情報 (研究プロジェクト等) S2009-0027-N0
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