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SYSTEM FOR ANALYZING EXPRESSION PROFILE AND PROGRAM THEREOF

外国特許コード F110002384
掲載日 2011年1月20日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2010JP001867
国際公開番号 WO 2010/106794
国際出願日 平成22年3月16日(2010.3.16)
国際公開日 平成22年9月23日(2010.9.23)
優先権データ
  • 特願2009-063273 (2009.3.16) JP
発明の名称 (英語) SYSTEM FOR ANALYZING EXPRESSION PROFILE AND PROGRAM THEREOF
発明の概要(英語) Provided is a system for analyzing an expression profile whereby a great deal of expression profile data obtained by using a next-generation high-speed sequencer or a similar experimental technique is analyzed at a high speed with a computer commonly employed and thus the gene expression patterns are visualized to thereby easily analyze to what gene a novel gene is similar in function. A system for analyzing an expression profile whereby gene expression profile data is analyzed, which comprises: a memory unit for regarding the count of mRNAs, that have been expressed from a subject gene to be evaluated under each of a plural number of gene expression conditions, as expression data and memorizing the expression data with respect to the name of each subject gene; a correspondence analysis unit for reading out the expression data of each subject gene from the memory unit and conducting correspondence analysis on the basis of the count under each of the expression conditions in the expression data; a coordinate conversion unit for converting n-dimensional scores obtained by the correspondence analysis (wherein n represents a positive integer) into coordinate values for m-dimensionally assigning each gene (wherein m is a positive integer that is less than or equal to n); and an image processing unit for plotting the corresponding coordinate values with respect to each gene and displaying the plot in an image display unit.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • MEIJI UNIVERSITY
  • The University of Shiga Prefecture
  • 発明者(英語)
  • YANO, Kentaro
  • SHIMIZU, Akifumi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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