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FEATURE PATTERN RECOGNIZING SYSTEM, METHOD, AND PROGRAM

外国特許コード F110002424
整理番号 69-PCT
掲載日 2011年2月3日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2005JP014130
国際公開番号 WO 2006/027913
国際出願日 平成17年8月2日(2005.8.2)
国際公開日 平成18年3月16日(2006.3.16)
優先権データ
  • 特願2004-233848 (2004.8.10) JP
発明の名称 (英語) FEATURE PATTERN RECOGNIZING SYSTEM, METHOD, AND PROGRAM
発明の概要(英語) A feature pattern recognizing system, its method, and a program for recognizing a feature pattern present in a sequence with high accuracy. The discrete symbols (such as base symbols) constituting a sequence (such as a DNA sequence) to be judged are digitized by using the frequency determined for each sequence position and for each type of the discrete symbols to create examination data or an examination data matrix Xtest. A matrix operation (such as Ytest=WpromXtest) of multiplying a separation matrix (such as Wprom) determined by independent component analysis or main component analysis by the examination data or the examination data matrix Xtest to determine separated data or a separated data matrix Ytest. By judging on which side of a threshold a feature judgment element (such as the element in the first line) of Ytest is present, it is judged by using the feature judgment element (elements in lines may be used) whether or not any feature pattern (such as a promoter) is present in the sequence.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • WASEDA UNIVERSITY
  • 発明者(英語)
  • MATSUYAMA, Yasuo
  • KAWAMURA, Ryo
  • SHIMODA, Keita
国際特許分類(IPC)
指定国 AE,AG,AL,AM,AT,AU,AZ,BA,BB,BG,BR,BW,BY,BZ,CA,CH,CN,CO,CR,CU,CZ,DE,DK,DM,DZ,EC,EE,EG,ES,FI,GB,GD,GE,GH,GM,HR,HU,ID,IL,IN,IS,JP,KE,KG,KM,KP,KR,KZ,LC,LK,LR,LS,LT,LU,LV,MA,MD,MG,MK,MN,MW,MX,MZ,NA,NG,NI,NO,NZ,OM,PG,PH,PL,PT,RO,RU,SC,SD,SE,SG,SK,SL,SM,SY,TJ,TM,TN,TR,TT,TZ,UA,UG,US,UZ,VC,VN,YU,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF,BJ,CF,CG,CI,CM,GA,GN,GQ,GW,ML,MR,NE,SN,TD,TG),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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