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APPARATUS FOR DETERMINING BRAIN ATROPHY, METHOD OF DETERMINING BRAIN ATROPHY AND PROGRAM FOR DETERMINING BRAIN ATROPHY

外国特許コード F110002439
整理番号 S2006-0759-C0
掲載日 2011年3月4日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP056839
国際公開番号 WO 2007/114238
国際出願日 平成19年3月29日(2007.3.29)
国際公開日 平成19年10月11日(2007.10.11)
優先権データ
  • 特願2006-094442 (2006.3.30) JP
発明の名称 (英語) APPARATUS FOR DETERMINING BRAIN ATROPHY, METHOD OF DETERMINING BRAIN ATROPHY AND PROGRAM FOR DETERMINING BRAIN ATROPHY
発明の概要(英語) Since brain atrophy occurs not only in a specific cross-section but over the whole brain or remarkably in a specific lobe (for example, the temporal lobe), it is desirable that the determination of brain atrophy is conducted not only by determining the atrophy in the frontal lobe but also checking the atrophy in the temporal lobe, the parietal lobe and the occipital lobe. Intracranial capacity, gray matter volume and white matter volume are individually extracted, computed and expressed in numerical values via image processing with the use of a plural number of MRI slice images and the like. Using the proportions of these numerical values, the ratio of the gray matter and the ratio of the white matter to the whole brain are computed. By comparing a number of measurement data obtained by the automated computing as described above with clinical cases, brain atrophy is objectively determined.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
  • NATIONAL UNIVERSITY CORPORATION HAMAMATSU UNIVERSITY SCHOOL OF MEDICINE
  • 発明者(英語)
  • YAMAMOTO, Seiji
  • TSAGAAN, Baigalmaa
  • ABE, Keiichi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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