TOP > 外国特許検索 > OPTICALLY RECONFIGURABLE GATE ARRAY WRITE STATE INSPECTION METHOD, WRITE STATE INSPECTION DEVICE, AND OPTICALLY RECONFIGURABLE GATE ARRAY

OPTICALLY RECONFIGURABLE GATE ARRAY WRITE STATE INSPECTION METHOD, WRITE STATE INSPECTION DEVICE, AND OPTICALLY RECONFIGURABLE GATE ARRAY 実績あり

外国特許コード F110002456
整理番号 4014PCT
掲載日 2011年3月7日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2005JP011026
国際公開番号 WO 2005/125013
国際出願日 平成17年6月16日(2005.6.16)
国際公開日 平成17年12月29日(2005.12.29)
優先権データ
  • 特願2004-181913 (2004.6.18) JP
発明の名称 (英語) OPTICALLY RECONFIGURABLE GATE ARRAY WRITE STATE INSPECTION METHOD, WRITE STATE INSPECTION DEVICE, AND OPTICALLY RECONFIGURABLE GATE ARRAY 実績あり
発明の概要(英語) There is provided a write state inspection technique not requiring a circuit dedicated to a write state inspection of inside of a logical circuit of the ORGA. An optical signal pattern configures the logical circuit structure in the ORGA as follows: when an optical signal irradiated to the optically reconfigurable bit element to be inspected is switched from ON to OFF, at least one logical level or output impedance is changed. A first and a second optical signal pattern in which an optical signal irradiated to the optically reconfigurable bit element to be inspected is ON or OFF are successively irradiated/inputted to the logical circuit. Together with this, each of the output states is detected by an output state detection circuit connected to the respective logical output terminals and detecting whether the logical level of the output terminal is at H level, L level, or high impedance. The state detected is compared to the normal output state of the inputted optical signal pattern so as to judge whether the information write state by the optical signal for each optically reconfigurable bit element is successful.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • WATANABE, Minoru
  • KOBAYASHI, Fuminori
国際特許分類(IPC)
指定国 AE,AE(UTILITY MODEL),AG,AL,AL(UTILITY MODEL),AM,AM(PROVISIONAL PATENT),AM(UTILITY MODEL),AT,AT(UTILITY MODEL),AU,AZ,AZ(UTILITY MODEL),BA,BB,BG,BG(UTILITY MODEL),BR,BR(UTILITY MODEL),BW,BY,BY(UTILITY MODEL),BZ,BZ(UTILITY MODEL),CA,CH,CN,CN(UTILITY MODEL),CO,CO(UTILITY MODEL),CR,CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CU,CZ,CZ(UTILITY MODEL),DE,DE(UTILITY MODEL),DK,DK(UTILITY MODEL),DM,DZ,EC,EC(UTILITY MODEL),EE,EE(UTILITY MODEL),EG,EG(UTILITY MODEL),ES,ES(UTILITY MODEL),FI,FI(UTILITY MODEL),GB,GD,GE,GE(UTILITY MODEL),GH,GM,HR(CONSENSUAL PATENT),HR,HU,HU(UTILITY MODEL),ID,IL,IN,IS,KE,KE(UTILITY MODEL),KG,KG(UTILITY MODEL),KM,KP(INVENTOR'S CERTIFICATE),KP,KP(UTILITY MODEL),KR,KR(UTILITY MODEL),KZ,KZ(PROVISIONAL PATENT),KZ(UTILITY MODEL),LC,LK,LR,,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,MC,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF,BJ,CF,CG,CI,CM,GA,GN,GQ,GW,ML,MR,NE,SN,TD,TG,BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
詳細は、下記「問合せ先」まで直接お問い合わせください。

PAGE TOP

close
close
close
close
close
close