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NEEDLE PROBE FOR COOLING OPERATION AND COOLING OPERATION SYSTEM 実績あり

外国特許コード F110002472
整理番号 7080PCT
掲載日 2011年3月8日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP000639
国際公開番号 WO 2009/125535
国際出願日 平成21年2月17日(2009.2.17)
国際公開日 平成21年10月15日(2009.10.15)
優先権データ
  • 特願2008-102974 (2008.4.11) JP
  • 特願2008-298861 (2008.11.22) JP
発明の名称 (英語) NEEDLE PROBE FOR COOLING OPERATION AND COOLING OPERATION SYSTEM 実績あり
発明の概要(英語) Provided are a needle probe for cooling operation and a cooling operation system, in which a very small area can be precisely cooled. A needle probe (10) for cooling operation includes a first cylindrical body (14) and a second cylindrical body (12) made of thin metals of different kinds and extending in a state of being electrically insulated from each other. The first cylindrical body (14) and second cylindrical body (12) serve as channels for refrigerant as well as compensation conduction wires for a thermocouple. One end of each of the first cylindrical body (14) and second cylindrical body (12) is closed and bonded to form a tip end portion (18). The tip end portion (18) serves as a temperature measurement contact of a thermocouple. A very small interconnection portion (20) for interconnecting the inside and outside of the first cylindrical body (14) is formed near the tip end portion (18). Refrigerant is introduced into the first cylindrical body (14), and when the refrigerant is passed through the very small interconnection portion (20) and introduced to the second tubular body (12), the refrigerant evaporates or adiabatically expands, whereby cold heat usable for cooling the tip end portion (18) is generated. The tip end portion (18) is applied to a target area to be treated, thereby cooling the target area.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National University Corporation Kyushu Institute of Technology
  • 発明者(英語)
  • YAMAKAWA, Takeshi
  • ZIMIN, Lev Grigorievich
  • ZIMIN, Yury L'vovich
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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