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GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM 実績あり

外国特許コード F110002491
整理番号 5060PCT
掲載日 2011年3月10日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP056149
国際公開番号 WO 2007/111288
国際出願日 平成19年3月26日(2007.3.26)
国際公開日 平成19年10月4日(2007.10.4)
優先権データ
  • 特願2006-088695 (2006.3.28) JP
発明の名称 (英語) GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM 実績あり
発明の概要(英語) A generating device is provided to generate such a set of test vectors as reduces a difference between logic values that occurs before and after scan capture with respect to an output of a scan cell included in a full scan sequence circuit. A generating device (200) generates a set of initial test vectors (216) for a logic circuit. The generating device (200) is comprised of a subject test vector specifying unit (204) for specifying test vectors to be selected which satisfy a prescribed standard for the number of bits (the number of transit bits) among each test vector of the set of the initial test vectors (216) where a difference between logic values occurs before and after scan capture with respect to an output of a scan cell included in the sequence circuit, and a test vector set converter (206) for converting an output of a scan cell included in the sequence circuit so as to reduce the number of transit bits with respect to a test vector to be selected and specified by the subject test vector specifying unit (204).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Japan Science and Technology Agency
  • Kyushu Institute of Technology
  • System JD Co., Ltd.
  • 発明者(英語)
  • WEN, Xiaoqing
  • KAJIHARA, Seiji
  • MIYASE, Kohei
  • MINAMOTO, Yoshihiro
  • DATE, Hiroshi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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