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METHOD FOR DETECTION OF INFECTION BY PATHOGENIC NEISSERIA BACTERIA USING PARTIAL SUGAR CHAIN EPITOPE, AND VACCINE AGAINST THE BACTERIA コモンズ 新技術説明会

外国特許コード F110002561
整理番号 H20-034-2
掲載日 2011年3月23日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP069532
国際公開番号 WO 2010/134225
国際出願日 平成21年11月18日(2009.11.18)
国際公開日 平成22年11月25日(2010.11.25)
優先権データ
  • 特願2009-122595 (2009.5.20) JP
発明の名称 (英語) METHOD FOR DETECTION OF INFECTION BY PATHOGENIC NEISSERIA BACTERIA USING PARTIAL SUGAR CHAIN EPITOPE, AND VACCINE AGAINST THE BACTERIA コモンズ 新技術説明会
発明の概要(英語) An attention is focused on a branched structure of a core sugar chain of LOS produced by meningitis-inducing bacteria (Neisseria bacteria), and a tool which enables the diagnosis of meningitis by utilizing not the entire structure of the sugar chain but a partial structure of the core sugar chain is provided. In deacylated LOS, a functional group such as a phosphate group and an acetyl group expressed in the core sugar chain is also removed, and therefore deacylated LOS cannot be utilized for detecting a bacterium capable of producing the core sugar chain containing such a functional group. Thus, also provided is a diagnosis tool which is free of the concerns for those constraints. Further disclosed is a vaccine against meningitis-inducing bacteria (Neisseria bacteria), which is prepared utilizing a partial structure of the core sugar chain without carrying out deacylation. The vaccine utilizes at least one (e.g., several) partial sugar chain containing the core sugar chain, and is a vaccine which is developed based on an innovative idea so as to deal with the mutation of meningitis-inducing bacteria (Neisseria bacteria).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION TOTTORI UNIVERSITY
  • 発明者(英語)
  • YAMASAKI, Ryohei
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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