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EXAMINATION VALUE PREDICTING DEVICE USING ELECTROPHORESIS WAVEFORM, PREDICTING METHOD, AND PREDICTING PROGRAM

外国特許コード F110002569
整理番号 S2007-0877-C0
掲載日 2011年3月24日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2008JP054326
国際公開番号 WO 2008/111566
国際出願日 平成20年3月10日(2008.3.10)
国際公開日 平成20年9月18日(2008.9.18)
優先権データ
  • 特願2007-061704 (2007.3.12) JP
発明の名称 (英語) EXAMINATION VALUE PREDICTING DEVICE USING ELECTROPHORESIS WAVEFORM, PREDICTING METHOD, AND PREDICTING PROGRAM
発明の概要(英語) An examination value predicting device, a predicting method, and a predicting program for accurately predicting the quantity of specific substance or presence/absence of a disease. The examination value predicting method comprises a first step (S2) at which electrophoresis waveform data including a mobility and an absorbance corresponding to the mobility and a prediction formula used for predicting the quantity of predetermined substance in a sample or presence/absence of a disease of an organism from which the sample is taken is recorded in a recording unit, a prediction formula which is a regression formula of an explanation variable representing the absorbance corresponding to the mobility of corrected waveform data created by normalizing electrophoresis waveform data on subjects and correcting the electrophoresis waveform data on subjects with respect to the area and an object variable representing the quantity of predetermined substance or presence/absence of a disease concerning the subjects is used, and corrected waveform data is created by normalizing the electrophoresis waveform data recorded in the recording unit and by correcting the electrophoresis waveform data with respect to the area and a second step (S4) at which the absorbance of the corrected waveform data created from the recorded electrophoresis waveform data is substituted for the absorbance corresponding to the mobility which is the explanation variable of the recorded prediction formula and a prediction value of the quantity of predetermined substance is computed.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KOCHI UNIVERSITY
  • 発明者(英語)
  • KATAOKA, Hiromi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO,AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME(PETTY PATENT),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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