TOP > 外国特許検索 > ANALOG DIGITAL CONVERTER, A/D CONVERSION STAGE, METHOD FOR GENERATING DIGITAL SIGNAL CORRESPONDING TO ANALOG SIGNAL, AND METHOD FOR GENERATING SIGNAL INDICATING CONVERSION ERROR IN THE A/D CONVERSION STAGE

ANALOG DIGITAL CONVERTER, A/D CONVERSION STAGE, METHOD FOR GENERATING DIGITAL SIGNAL CORRESPONDING TO ANALOG SIGNAL, AND METHOD FOR GENERATING SIGNAL INDICATING CONVERSION ERROR IN THE A/D CONVERSION STAGE

外国特許コード F110002588
整理番号 S2006-1059-C0
掲載日 2011年3月28日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP061635
国際公開番号 WO 2007/142328
国際出願日 平成19年6月8日(2007.6.8)
国際公開日 平成19年12月13日(2007.12.13)
優先権データ
  • 特願2006-160159 (2006.6.8) JP
  • 特願2006-198380 (2006.7.20) JP
発明の名称 (英語) ANALOG DIGITAL CONVERTER, A/D CONVERSION STAGE, METHOD FOR GENERATING DIGITAL SIGNAL CORRESPONDING TO ANALOG SIGNAL, AND METHOD FOR GENERATING SIGNAL INDICATING CONVERSION ERROR IN THE A/D CONVERSION STAGE
発明の概要(英語) A sample value (R) at an A/D conversion stage (101) is subjected to a conversion operation (B) to generate a conversion result (D3). The conversion result (D3) is subjected to a sampling operation (A) by an A/D conversion stage (103). A sample value at an A/D conversion stage (105) is subjected to a conversion operation (B) to generate a conversion result (D4). The conversion result (D4) is subjected to the sampling operation (A) by an A/D conversion stage (107). The sample value at the A/D conversion stage (107) is subjected to the conversion operation (B) to generate a conversion result (D5). The conversion result (D5) is subjected to the sampling operation (A) by the A/D conversion stage (101). The sample value at the A/D conversion stage (103) is subjected to the conversion operation (B) to generate a conversion result (D6). The conversion result (D6) is subjected to the sampling operation (A) by the A/D conversion stage (105).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
  • 発明者(英語)
  • KAWAHITO, Shoji
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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