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METHOD OF, AND APPARATUS FOR, DETECTING OF ANY INTERACTION BETWEEN NUCLEIC ACID AND PROTEIN

外国特許コード F110002602
整理番号 S2008-0178-N0
掲載日 2011年3月29日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP062053
国際公開番号 WO 2007/145298
国際出願日 平成19年6月14日(2007.6.14)
国際公開日 平成19年12月21日(2007.12.21)
優先権データ
  • 特願2006-167898 (2006.6.16) JP
発明の名称 (英語) METHOD OF, AND APPARATUS FOR, DETECTING OF ANY INTERACTION BETWEEN NUCLEIC ACID AND PROTEIN
発明の概要(英語) Any interaction between nucleic acid and protein is easily detected with high sensitivity without the need of sample labeling with a fluorescent molecule or sample anchorage onto a metal thin-film. Accordingly, whether or not there is any occurrence of interaction between nucleic acid and protein in sample (S) is detected in an optical manner. In particular, the sample (S) is irradiated with excitation rays (Le) and with measuring rays (L2) for measuring of any photothermal effect produced in the sample (S) by the irradiation with the excitation rays (Le). On the basis of any phase change of the measuring rays (L2), there is produced a measurement signal for the photothermal effect in the sample (S) by the excitation rays (Le). From any change over time of the measurement signal, whether or not there is any occurrence of interaction between nucleic acid and protein is judged.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
  • KABUSHIKI KAISHA KOBE SEIKO SHO
  • 発明者(英語)
  • IKEBUKURO, Kazunori
  • KATAYAMA, Ryo
  • TAKAHASHI, Eiji
  • TAKAMATSU, Hiroyuki
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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