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GAS ANALYZER AND METHOD OF GAS ANALYSIS

外国特許コード F110002605
整理番号 S2006-1219-C0
掲載日 2011年3月29日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2007JP060599
国際公開番号 WO 2008/056458
国際出願日 平成19年5月24日(2007.5.24)
国際公開日 平成20年5月15日(2008.5.15)
優先権データ
  • 特願2006-304650 (2006.11.10) JP
発明の名称 (英語) GAS ANALYZER AND METHOD OF GAS ANALYSIS
発明の概要(英語) [PROBLEMS] To provide a gas analyzer that can be miniaturized and can detect a wide variety of gases with high sensitivity, and provide a method of gas analysis therewith. [MEANS FOR SOLVING PROBLEMS] Separation column (16) is so structured as to allow a sample gas together with a carrier gas to pass through the interior thereof. Surface acoustic device (17) comprises base material (21) with annularly continuous circular ring surface, formed of at least part of a spherical surface; surface acoustic wave generating means (22) capable of generating a surface acoustic wave propagating along the circular ring surface; and multiple reaction parts (23) disposed along the circular ring surface so as to change a given physical quantity of the surface acoustic wave in reaction to a component of the sample gas. The surface acoustic device (17) is arranged so that the sample gas having passed the separation column (16) reacts with the reaction parts (23). Measuring part (18) can measure the physical quantity of the surface acoustic wave propagating along the circular ring surface, and the component of the sample gas can be analyzed on the basis of the measured physical quantity.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • TOHOKU UNIVERSITY
  • 発明者(英語)
  • YAMANAKA, Kazushi
  • TSUJI, Toshihiro
  • IWATA, Naoya
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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