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PRECUT MATERIAL ALLOCATING METHOD, COMPUTER PROGRAM FOR THE PRECUT MATERIAL ALLOCATING METHOD, AND COMPUTER-READABLE RECORDING MEDIA

外国特許コード F110002655
整理番号 S2007-0779-C0
掲載日 2011年4月6日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2008JP067031
国際公開番号 WO 2009/038196
国際出願日 平成20年9月19日(2008.9.19)
国際公開日 平成21年3月26日(2009.3.26)
優先権データ
  • 特願2007-245815 (2007.9.21) JP
発明の名称 (英語) PRECUT MATERIAL ALLOCATING METHOD, COMPUTER PROGRAM FOR THE PRECUT MATERIAL ALLOCATING METHOD, AND COMPUTER-READABLE RECORDING MEDIA
発明の概要(英語) Provided is a precut material allocating method for allocating a plurality of products having a predetermined size to a parent material group composed of a plurality of parent materials of different sizes. The method comprises a sorting step of arraying the plural products sequentially of the sizes, a tentative allocation step of extracting the individual products in the array order and allocating the extracted products tentatively to the individual parent materials belonging to the parent material group, thereby to establish a plurality of tentative allocation states, a first standard step of selecting the tentative allocation state, in which the yield of the parent material used in the allocation is the highest, of the plural tentative allocation states established, as an allocation candidate, and a second standard step of selecting the tentative allocation state, in which the total of the remaining sizes of all the parent materials used for the allocation, of the plural tentative allocation states established, as the allocation candidate. The method further comprises a third standard step of comparing, if predetermined tentative allocation states are satisfied at the first standard step and the second standard step, the selected tentative allocation state and the remaining tentative allocation states, for the tentative allocation states individually selected at the first and second standard steps, thereby to select again the tentative allocation state, in which the total of the sizes of the individual parent materials used is the minimum, as the allocation candidate.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • OSAKA PREFECTURE UNIVERSITY PUBLIC CORPORATION
  • 発明者(英語)
  • TAKEYASU, Kazuhiro
  • TOYODA, Johsuke
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME(PETTY PATENT),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)

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