TOP > 外国特許検索 > ACOUSTIC MEASUREMENT DEVICE AND ACOUSTIC MEASUREMENT METHOD

ACOUSTIC MEASUREMENT DEVICE AND ACOUSTIC MEASUREMENT METHOD 新技術説明会

外国特許コード F110002695
整理番号 S2007-0915-C0
掲載日 2011年4月8日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2008JP062485
国際公開番号 WO 2009/008478
国際出願日 平成20年7月10日(2008.7.10)
国際公開日 平成21年1月15日(2009.1.15)
優先権データ
  • 特願2007-181146 (2007.7.10) JP
発明の名称 (英語) ACOUSTIC MEASUREMENT DEVICE AND ACOUSTIC MEASUREMENT METHOD 新技術説明会
発明の概要(英語) It is possible to realize a measurement system for accurately detecting a position of a sound source of a jet noise (screech) generated by a jet flow of a jet engine. High speed sampling is performed by applying a laser light into a jet flow and its surrounding by the schlieren optics and using a high speed optical sensor while shifting a measurement point. The value obtained by sampling is a result of the optical path curved by a density gradient generated in the arc-shape from the center of the jet air current. The value is subjected to a high-speed Fourier transform and decomposed into frequency components constituting the noise. After this, data belonging to a particular frequency is subjected to Abel transform so as to obtain a density gradient in the radial direction from the center of the jet air current. The obtained density gradient is visualized in a graph display so as to accurately know the position of the sound source and the state of the air current.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National University Corporation Gunma University
  • Japan Aerospace Exploration Agency
  • 発明者(英語)
  • ARAKI, Mikiya
  • SONE, Yusuke
  • KOJIMA, Takayuki
  • TAGUCHI, Hideyuki
  • SHIGA, Seiichi
  • OBOKATA, Tomio
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME(PETTY PATENT),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
ライセンスをご希望の方、特許の内容に興味を持たれた方は、下記までご連絡ください

PAGE TOP

close
close
close
close
close
close