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METHOD FOR CONTROLLING INTER-COMPONENT PHASE DIFFERENCE SOLITON AND INTER-COMPONENT PHASE DIFFERENCE SOLITON CIRCUIT DEVICE

外国特許コード F110002708
整理番号 S2008-0332-C0
掲載日 2011年4月8日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP053617
国際公開番号 WO 2009/107756
国際出願日 平成21年2月20日(2009.2.20)
国際公開日 平成21年9月3日(2009.9.3)
優先権データ
  • 特願2008-049605 (2008.2.29) JP
発明の名称 (英語) METHOD FOR CONTROLLING INTER-COMPONENT PHASE DIFFERENCE SOLITON AND INTER-COMPONENT PHASE DIFFERENCE SOLITON CIRCUIT DEVICE
発明の概要(英語) A method for controlling an inter-component phase difference soliton by using division or fusion caused by the interaction of an inter-component phase difference soliton without applying external energy. The method uses a line structure (10) where an inter-component phase difference soliton propagation line through which an inter-component phase difference soliton (So) capable of existing in a superconducting environment can travel is divided into branch lines (10-1, 10-2) at least at a branch end (Po) provided in the line. The inter-component phase difference soliton (So) in the main line (10M) which is the undivided line part is divided and made to enter the branch lines (10-1, 10-2) without supplying external energy. Alternatively, inter-component phase difference solitons (So1, So2) existing in the branch lines (10-1, 10-2) are fused without supplying external energy. Thus the inter-component phase difference soliton (So) is propagated through the main line (10M).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
  • Tokyo University of Science Educational Foundation Administrative Organization
  • KAGOSHIMA UNIVERSITY
  • 発明者(英語)
  • TANAKA, Yasumoto
  • IYO, Akira
  • SHIVAGAN, Dilip
  • SHIRAGE, Parasharam
  • TOKIWA, Kazuyasu
  • WATANABE, Tsuneo
  • TERADA, Norio
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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