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ULTRASONIC MEASUREMENT WAVEGUIDE ROD AND ULTRASONIC MEASUREMENT INSTRUMENT 新技術説明会

外国特許コード F110002731
整理番号 S2008-0102-C0
掲載日 2011年4月11日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2008JP070348
国際公開番号 WO 2009/063812
国際出願日 平成20年11月7日(2008.11.7)
国際公開日 平成21年5月22日(2009.5.22)
優先権データ
  • 特願2007-297307 (2007.11.15) JP
発明の名称 (英語) ULTRASONIC MEASUREMENT WAVEGUIDE ROD AND ULTRASONIC MEASUREMENT INSTRUMENT 新技術説明会
発明の概要(英語) [PROBLEMS] To provide an ultrasonic measurement waveguide rod easily manufacturable and hardly producing a noise echo. [MEANS FOR SOLVING PROBLEMS] An ultrasonic flaw detection waveguide rod (2) has a probe at one axial end thereof and a contact surface to be brought into contact with a test piece at the other end. The shape of a cross section of the rod (2) perpendicular to the axis is a polygon having sides any one (41A) of which is not parallel to all the other sides (41B, 41C, 41D). Since at least one pair of sides (41A, 41C) opposed to each other are not parallel to each other, it is prevented that an ultrasonic wave (P) is reflected by the outer surfaces having the nonparallel sides (41A, 41C) and returned as a noise echo to the probe (3). For example, the ultrasonic wave component reflected perpendicularly by one outer surface is reflected by the other outer surface and travels toward the outer surface having the side (41D). Therefore, an echo or a noise, hardly returns to the probe.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Nagaoka University of Technology
  • 発明者(英語)
  • IHARA, Ikuo
  • KAWASAKI, Tomonori
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME(PETTY PATENT),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)

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