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METHOD OF MEASURING MICROPARTICLES HAVING NUCLEIC ACID AND APPARATUS THEREFOR 新技術説明会

外国特許コード F110002771
整理番号 S2007-0882-C0
掲載日 2011年4月14日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2008JP061210
国際公開番号 WO 2008/156135
国際出願日 平成20年6月19日(2008.6.19)
国際公開日 平成20年12月24日(2008.12.24)
優先権データ
  • 特願2007-162261 (2007.6.20) JP
発明の名称 (英語) METHOD OF MEASURING MICROPARTICLES HAVING NUCLEIC ACID AND APPARATUS THEREFOR 新技術説明会
発明の概要(英語) [PROBLEMS] To provide a system whereby the state of contamination with microparticles having nucleic acid can be quickly and appropriately evaluated. [MEANS FOR SOLVING PROBLEMS] The above problem can be overcome by a system for measuring microparticles which comprises the following steps: (1) the microparticle-adhesion step wherein microparticles having nucleic acid are adhered to a member for microparticle-adhesion; (2) the membrane-breakage step wherein the membranes of the adhered microparticles are broken by electrical discharge; (3) the electrophoresis step wherein the above-described microparticles are electrophoresed in the thickness direction of a gel so that the nucleic acid in the microparticles is migrated from the negative electrode side toward the positive electrode side, thereby adhering the nucleic acid to the surface of a member for nucleic acid-detection; and (4) the nucleic acid-measurement step wherein the surface of the member for nucleic acid-detection as described above is fluorescently stained and thus the nucleic acid concentration is measured.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • TOYOHASHI UNIVERSITY of TECHNOLOGY
  • 発明者(英語)
  • MIZUNO, Akira
  • TAKASHIMA, Kazunori
  • YASUDA, Hachiro
  • Rahman Md. Masudur
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME(PETTY PATENT),MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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