TOP > 外国特許検索 > PHASE DIFFERENCE ENHANCED IMAGING METHOD (PADRE), FUNCTIONAL IMAGE CREATING METHOD, PHASE DIFFERENCE ENHANCED IMAGING PROGRAM, PHASE DIFFERENCE ENHANCED IMAGING APPARATUS, FUNCTIONAL IMAGE CREATING APPARATUS, AND MAGNETIC RESONANCE IMAGING (MRI) APPARATUS

PHASE DIFFERENCE ENHANCED IMAGING METHOD (PADRE), FUNCTIONAL IMAGE CREATING METHOD, PHASE DIFFERENCE ENHANCED IMAGING PROGRAM, PHASE DIFFERENCE ENHANCED IMAGING APPARATUS, FUNCTIONAL IMAGE CREATING APPARATUS, AND MAGNETIC RESONANCE IMAGING (MRI) APPARATUS 新技術説明会

外国特許コード F110002885
整理番号 S2009-0012-C0
掲載日 2011年5月9日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP070763
国際公開番号 WO 2010/073923
国際出願日 平成21年12月11日(2009.12.11)
国際公開日 平成22年7月1日(2010.7.1)
優先権データ
  • 特願2008-334556 (2008.12.26) JP
発明の名称 (英語) PHASE DIFFERENCE ENHANCED IMAGING METHOD (PADRE), FUNCTIONAL IMAGE CREATING METHOD, PHASE DIFFERENCE ENHANCED IMAGING PROGRAM, PHASE DIFFERENCE ENHANCED IMAGING APPARATUS, FUNCTIONAL IMAGE CREATING APPARATUS, AND MAGNETIC RESONANCE IMAGING (MRI) APPARATUS 新技術説明会
発明の概要(英語) Provided are a functional image creating method and a functional image creating apparatus wherein activated areas can be rendered. A complex image (.sigma.r(x)) created from an MR signal occurring during an inactive state and a complex image (.sigma.'r(x)) obtained by filtering the complex image (.sigma.r(x)) are used to create a phase difference image (PDr(x)). A complex image (.sigma.a(x)) created from an MR signal occurring during an active state and a complex image (.sigma.'a x)) obtained by filtering the complex image (.sigma.a(x)) are used to create a phase difference image (PDa(x)). The phase difference image (PDr(x)) and phase difference image (PDa(x)) are used to create functional signal images (diff1(x), diff2(x)). The functional signal image (diff1(x)) or the functional signal image (diff2(x)) is masked by an intensity image (Mr(x)), an intensity image (Ma(x)), a standard image or a morphological image (I(x)) to create a functional image (I'(x)) in which activated areas have been rendered.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION KUMAMOTO UNIVERSITY
  • 発明者(英語)
  • YONEDA Tetsuya
  • HIAI Yasuhiro
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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