TOP > 外国特許検索 > METHOD FOR IMAGING STRUCTURE DEFECT, DEVICE FOR IMAGING STRUCTURE DEFECT, METHOD FOR IMAGING BUBBLE OR LESION, AND DEVICE FOR IMAGING BUBBLE OR LESION

METHOD FOR IMAGING STRUCTURE DEFECT, DEVICE FOR IMAGING STRUCTURE DEFECT, METHOD FOR IMAGING BUBBLE OR LESION, AND DEVICE FOR IMAGING BUBBLE OR LESION

外国特許コード F110002980
整理番号 S2008-0784-C0
掲載日 2011年5月10日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP059212
国際公開番号 WO 2010/007830
国際出願日 平成21年5月19日(2009.5.19)
国際公開日 平成22年1月21日(2010.1.21)
優先権データ
  • 特願2008-187578 (2008.7.18) JP
発明の名称 (英語) METHOD FOR IMAGING STRUCTURE DEFECT, DEVICE FOR IMAGING STRUCTURE DEFECT, METHOD FOR IMAGING BUBBLE OR LESION, AND DEVICE FOR IMAGING BUBBLE OR LESION
発明の概要(英語) Provided is a method and device for imaging a structure defect with a high frequency resolution and a high spatial resolution and realizing an improved capability of discrimination between a closed crack and an open crack. Furthermore provided is a method and device for imaging a bubble or a lesion with a high frequency resolution and a high spatial resolution and realizing an improved capability of discrimination between a tissue and a bubble or a lesion. The structure defect imaging device includes an ultrasonic transmitter and an array receiver arranged at first places. A burst ultrasonic wave is directed to a structure from the ultrasonic transmitter, a scattered wave from a defect is received by the array receiver, and a received signal is obtained. The received signal is made to pass through a band-pass filter passing a specific frequency component, and the resultant signal is shifted by different periods of time corresponding to the positions of the reception sensor elements of the array receiver. The shifted signals are added together, and thereby a processing signal is generated. From the processing signal, an image of the defect is obtained. Then the ultrasonic transmitter and the array receiver are rearranged at second places. A similar operation is conducted, and another image of the defect is obtained. The common part of the two images is extracted.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Tohoku University
  • 発明者(英語)
  • YAMANAKA Kazushi
  • OHARA Yoshikazu
  • SHINTAKU Yohei
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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