TOP > 外国特許検索 > SIGNAL DETECTION DEVICE, SIGNAL DETECTION METHOD, AND METHOD OF MANUFACTURING SIGNAL DETECTION DEVICE

SIGNAL DETECTION DEVICE, SIGNAL DETECTION METHOD, AND METHOD OF MANUFACTURING SIGNAL DETECTION DEVICE 新技術説明会

外国特許コード F110003002
整理番号 S2009-0022-C0
掲載日 2011年5月10日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2009JP064929
国際公開番号 WO 2010/041526
国際出願日 平成21年8月27日(2009.8.27)
国際公開日 平成22年4月15日(2010.4.15)
優先権データ
  • 特願2008-262688 (2008.10.9) JP
発明の名称 (英語) SIGNAL DETECTION DEVICE, SIGNAL DETECTION METHOD, AND METHOD OF MANUFACTURING SIGNAL DETECTION DEVICE 新技術説明会
発明の概要(英語) A signal detection device wherein a wavelet transformation of an object signal can be performed in real time by using a real signal mother wavelet. The signal detection device comprises an object signal decomposition unit having a lifting scheme structure or a multiple analysis structure using a multiresolution analysis and a parasitic filter coupled to a desired decomposition filter of the object signal decomposition unit. When a real signal mother wavelet is inputted to the object signal decomposition unit and a general discrete wavelet transformation is performed, the parasitic filter substantially reproduces the inputted real signal mother wavelet and outputs the reproduced one. The real signal mother wavelet is formed of an object signal. The signal detection device further comprises a means for inputting the object signal to the object signal decomposition unit and performing the discrete wavelet transformation by using the real signal mother wavelet and a means for calculating a wavelet instantaneous correlation on the basis of the output of the parasitic filter.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National University Corporation TOYOHASHI UNIVERSITY OF TECHNOLOGY
  • 発明者(英語)
  • ZHANG, Zhong
  • MIYAKE, Tetsuo
  • IMAMURA, Takashi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
ご興味のある特許について詳しく内容をお知りになりたい方は、下記までお問い合せください。

PAGE TOP

close
close
close
close
close
close