TOP > 外国特許検索 > Method and device for measuring thermoelectric characteristics of combinatorial specimen

Method and device for measuring thermoelectric characteristics of combinatorial specimen

外国特許コード F110003284
整理番号 A051-69EP
掲載日 2011年6月22日
出願国 欧州特許庁(EPO)
出願番号 02705181
公報番号 1400804
公報番号 1400804
出願日 平成14年3月14日(2002.3.14)
公報発行日 平成16年3月24日(2004.3.24)
公報発行日 平成28年1月13日(2016.1.13)
国際出願番号 JP2002002415
国際公開番号 WO2002075297
国際出願日 平成14年3月14日(2002.3.14)
国際公開日 平成14年9月26日(2002.9.26)
優先権データ
  • 2002JP002415 (2002.3.14) WO
  • 特願2001-075954 (2001.3.16) JP
発明の名称 (英語) Method and device for measuring thermoelectric characteristics of combinatorial specimen
発明の概要(英語) The present invention provides a method and device for measuring thermoelectric characteristics of a combinatorial sample, wherein the method and device are useful for rapid sample evaluation, the investigation of thermoelectric materials, and the carrier control of semiconductors. The device includes combinatorial samples (10) patterned with a metal mask, a pair of sample holders (11 and 12) for applying a small temperature gradient to the sample (10), a thermocouple (14) for measuring the temperature gradient, and a probe pin array (15) in contact with the sample (10).
特許請求の範囲(英語) [claim1]
1. A method for measuring thermoelectric characteristics of a patterned combinatorial sample, comprising the steps of: applying a temperature gradient to a patterned combinatorial sample disposed between two or more hot baths wherein the temperature of one bath is up to 3 deg.C higher than the other bath; measuring the temperature gradient of the patterned combinatorial sample; obtaining a plurality of electrical signals in the temperature gradient direction from the patterned combinatorial sample; and determining the thermoelectric characteristics based on the temperature gradient and the plurality of electrical signals.
[claim2]
2. A device for measuring thermoelectric characteristics of a patterned combinatorial sample, comprising: two or more hot baths for applying a temperature gradient to the patterned combinatorial sample, wherein the temperature of one bath is up to 3 deg.C higher than the other bath; a means for measuring the temperature gradient of the patterned combinatorial sample; a component for obtaining a plurality of electrical signals in the temperature gradient direction, the component being configured to contact with or connect to the patterned combinatorial sample; and means for determining the thermoelectric characteristics based on the temperature gradient and the plurality of electrical signals.
  • 出願人(英語)
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • KOINUMA HIDEOMI
  • KAWAJI HITOSHI
  • ITAKA KENJI
  • MINAMI HIDEKI
国際特許分類(IPC)
欧州特許分類/主・副
  • G01K007/02
  • H01L035/00
  • S01R031/26
指定国 Contracting States: DE FR GB
参考情報 (研究プロジェクト等) CREST Single Molecule and Atom Level Reactions AREA
ライセンスをご希望の方、特許の内容に興味を持たれた方は、問合せボタンを押してください。

PAGE TOP

close
close
close
close
close
close