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Pump probe measuring device, and scanning probe microscope apparatus using the device

外国特許コード F110003675
整理番号 AF01-01WO
掲載日 2011年7月1日
出願国 欧州特許庁(EPO)
出願番号 07832710
公報番号 2090880
公報番号 2090880
出願日 平成19年11月28日(2007.11.28)
公報発行日 平成21年8月19日(2009.8.19)
公報発行日 平成28年3月23日(2016.3.23)
国際出願番号 JP2007072988
国際公開番号 WO2008066090
国際出願日 平成19年11月28日(2007.11.28)
国際公開日 平成20年6月5日(2008.6.5)
優先権データ
  • 2007JP072988 (2007.11.28) WO
  • 特願2006-322662 (2006.11.29) JP
発明の名称 (英語) Pump probe measuring device, and scanning probe microscope apparatus using the device
発明の概要(英語) A pump probe measuring device (1) includes an ultrashort optical pulse laser generator (11) for generating a first ultrashort optical pulse train, which becomes a pump light, and a second ultrashort optical pulse train, which becomes a probe light, a delay time adjusting unit (15) for adjusting a delay time between ultrashort optical pulse trains, a first pulse picker and a second pulse picker (13, 14) for accepting each of the first and the second ultrashort optical pulse trains and allowing only one pulse to be transmitted at an arbitrary repetition periodicity, thus reducing the effective repetition frequency of the optical pulses, a delay time modulation unit (10) for periodically changing a position through which pulses are transmitted by the first and the second pulse pickers (13, 14), an irradiation optical system (16) for applying pump light and probe light to a sample (19), a measuring unit (20) for detecting probe signals from a sample (19), and a lock-in amplifier (18).
特許請求の範囲(英語) [claim1]
1. A pump probe measuring device (1) comprising: an ultrashort optical pulse laser generator (11) for generating a first ultrashort optical pulse train, which becomes a pump light reaching to a sample (19) first, and a second ultrashort optical pulse train, which becomes a probe light; a measuring unit (20) for detecting probe signals from the sample (19) equipped with an irradiation optical system (16) for guiding said pump light and said probe light to the surface of said sample (19); a lock-in detecting unit (18) for performing a phase-sensitive detection of probe signals from said sample (19); a first pulse picker (13) and a second pulse picker (14) for reducing effective repetition frequency of optical pulses by accepting each of said first and second ultrashort optical pulse trains and transmitting only one pulse at an arbitrary repetition frequency; a delay time modulating unit (10) for detecting optical pulses generated from the ultrashort optical pulse laser generator (11), driving the pulse pickers (13,14), and periodically changing a selection position through which optical pulses are transmitted by said first and second pulse pickers (13, 14); wherein the first or the second pulse picker (13, 14) changes the selection position through which optical pulses are transmitted, thus changing the delay time between the optical pulse that is transmitted through said second pulse picker (14) or the optical pulse that is transmitted through said first pulse picker (13); and a modulation frequency of the selection position through which optical pulse trains are transmitted is used as a reference signal in the lock-in detecting unit (18), which is output from the delay time
[claim2]
2. The pump probe measuring device (1) as set forth in claim 1, wherein each pulse picker (13, 14) comprises a Pockels cell (13a, 14a) and a light polarizer (13b, 14b), and it transmits or blocks arbitrary optical pulses.
[claim3]
3. The pump probe measuring device (1) as set forth in claim 1 or 2, wherein said delay time modulation unit (10) comprises: a photosensor (21) for detecting optical pulses generated by said ultrashort optical pulse laser generator (11); a counting means (22) for counting pulse signals from said photosensor (21); a delaying means (23, 24) to be connected to said counting means (22); and a driving means (25, 26) for said pulse pickers.
[claim4]
4. The pump probe measuring device (1) as set forth in claim 1, wherein said ultrashort optical pulse laser generator (11) includes one or two ultrashort optical pulse laser sources (11, 31, 32), each of which comprises a titanium sapphire laser.
[claim5]
5. The pump probe measuring device (1) as set forth in claim 1, wherein said ultrashort optical pulse laser generator (11) comprises: an ultrashort optical pulse laser source (11); and an optical device (12a, 12b) for dividing the ultrashort optical pulses generated by said ultrashort optical pulse laser source (11) to form the pump light and the probe light, and the pump light and the probe light are transmitted into the corresponding pulse pickers (13, 14).
[claim6]
6. The pump probe measuring device (1) as set forth in any one of claims 1, 4, and 5, wherein an optical system employing an optical path length adjustment mechanism using movable mirrors (15a1, 15a2) is provided with a delay time adjusting unit (15).
[claim7]
7. The pump probe measuring device (1) as set forth in claim 1, wherein said ultrashort optical pulse laser generator (11) comprises: two ultrashort optical pulse laser sources (31, 32), wherein an oscillation phase of the pump light and the probe light is set by using a synchronous oscillation control unit (33), and
wherein the ultrashort optical pulses generated by each ultrashort optical pulse laser source (31, 32) are transmitted into the corresponding pulse pickers (13, 14) as the pump light and the probe light, respectively.
[claim8]
8. The pump probe measuring device (1) as set forth in claim 5 or 7, wherein a cavity dumper is provided with said ultrashort optical pulse laser source (11).
[claim9]
9. The pump probe measuring device (1) as set forth in claim 1, wherein an optical system for applying the pump light and the probe light to the surface of the sample (19) and an optical system for measuring the intensity of said reflected probe light is provided with said measuring unit (20), and said intensity of the reflected probe light is output as probe signals.
[claim10]
10. A scanning probe microscope apparatus (50) comprising a pump probe measuring device (1) as set forth in any one of claims 1 to 8, wherein a scanning tunneling microscope (53) for measuring local physical properties at the position where pump light and probe light are applied is provided as said measuring unit (20), and the probe signals obtained by said scanning tunneling microscope (53) are output.
[claim11]
11. Various measuring devices including a pump probe measuring device (1) as set forth in any one of claims 1 to 8 as one of their components.
  • 出願人(英語)
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • SHIGEKAWA HIDEMI
  • TAKEUCHI OSAMU
国際特許分類(IPC)
指定国 Contracting States: AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR
参考情報 (研究プロジェクト等) CREST Novel Measuring and Analytical Technology Contributions to the Elucidation and Application of Material AREA
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