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PUMP PROBE MEASURING DEVICE, AND SCANNING PROBE MICROSCOPE APPARATUS USING THE DEVICE

外国特許コード F110004777
整理番号 AF01-01WO
掲載日 2011年7月21日
出願国 大韓民国
出願番号 20097012899
公報番号 20090082934
公報番号 101120534
出願日 平成19年11月28日(2007.11.28)
公報発行日 平成21年7月31日(2009.7.31)
公報発行日 平成24年5月30日(2012.5.30)
優先権データ
  • 特願2006-322662 (2006.11.29) JP
発明の名称 (英語) PUMP PROBE MEASURING DEVICE, AND SCANNING PROBE MICROSCOPE APPARATUS USING THE DEVICE
発明の概要(英語)

Provided is a pump probe measuring device (1) comprising an ultrashort optical pulse laser generating unit (11) for generating a first ultrashort optical pulse train to become a pump light and a second ultrashort optical pulse train to become a probe light, a delay time adjusting unit (15) for adjusting the delay time of the ultrashort optical pulse train, first and second pulse pickers (13 and 14) for introducing the first and second ultrashort optical pulse trains, respectively, to transmit one pulse at an arbitrary repetition frequency thereby to reduce the effective repetition frequencies of the optical pulses, a delay time modulating unit (10) for changing periodically the selected portions of the pulses to be passed from the first and second pulse pickers (13 and 14), an irradiating optical system (16) for irradiating a specimen (19) with the pump light and the probe light,

and a measurement unit (20) for detecting a probe signal from the specimen (19), and a lock-in detecting unit (18).

  • 出願人(英語)
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • SHIGEKAWA HIDEMI,
  • TAKEUCHI OSAMU
国際特許分類(IPC)
参考情報 (研究プロジェクト等) CREST Novel Measuring and Analytical Technology Contributions to the Elucidation and Application of Material AREA
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