TOP > 外国特許検索 > Delay time modulation femtosecond time-resolved scanning probe microscope apparatus

Delay time modulation femtosecond time-resolved scanning probe microscope apparatus

外国特許コード F110005052
整理番号 A041-48US
掲載日 2011年8月18日
出願国 アメリカ合衆国
出願番号 49657102
公報番号 20050035288
公報番号 7002149
出願日 平成14年11月25日(2002.11.25)
公報発行日 平成17年2月17日(2005.2.17)
公報発行日 平成18年2月21日(2006.2.21)
国際出願番号 JP2002012273
国際公開番号 WO2003046519
国際出願日 平成14年11月25日(2002.11.25)
国際公開日 平成15年6月5日(2003.6.5)
優先権データ
  • 特願2001-360047 (2001.11.26) JP
  • 2002WO-JP12273 (2002.11.25) WO
発明の名称 (英語) Delay time modulation femtosecond time-resolved scanning probe microscope apparatus
発明の概要(英語) (US7002149)
Disclosed is a measuring apparatus for a physical phenomenon by photoexcitation, in particular a delay time modulated and time-resolved, scanning probe microscope apparatus providing an ultimate resolution both temporal and spatial.
The apparatus comprises an ultrashort laser pulse generator ( 2 ); a delay time modulating circuit ( 6 ) which splits an ultrashort laser pulse ( 3 ) produced by the ultrashort laser pulse generator ( 2 ) into two and which also modulates a delay time td between the two ultrashort laser pulses ( 4 and 5 ) with a frequency (omega); a scanning probe microscope ( 7 ); and a lock-in detection unit ( 8 ) which performs lock-in detection with the delay time modulation frequency (omega) of a probe signal ( 11 ) from the scanning probe microscope ( 7 ).
It can detect the delay time dependency of the probe signal ( 11 ) as its differential coefficient to the delay time, with no substantial influence from fluctuations in the intensity of ultrashort laser pulses ( 3 ) while preventing the probe apex ( 19 ) from thermal expansion and shrinkage by repeated irradiation with ultrashort laser pulses ( 3 ).
A photoexcited physical phenomenon dependent on a delay time between ultrashort laser pulses can thus be measured at a temporal resolution in the order of femtoseconds and at a spatial resolution in the order of angstroms.
特許請求の範囲(英語) [claim1]
1. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus, characterized in that it comprises: an ultrashort laser pulse generator;
a delay time modulating circuit for splitting an ultrashort laser pulse produced by said ultrashort laser pulse generator into two ultrashort laser pulses interspaced by a delay time while establishing a value for the delay time between the two ultrashort laser pulses and modulating the delay time centering about the established value with a fixed modulation frequency;a scanning probe microscope for scanning a specimen over a surface area thereof with a probe wherein the probe is disposed just above the specimen so that a tunnel junction is formed between a probe apex and a surface of said specimen when irradiated with said two ultrashort laser pulses modulated by said delay time modulating circuit;
and
a lock-in detection unit for lock-in-detecting a probe signal of the specimen irradiated with said ultrashort laser pulses in said scanning probe microscope using the modulation frequency for the delay time as a reference signal.
[claim2]
2. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 1, characterized in that said ultrashort laser pulse generator is adapted to produce a series of ultrashort laser pulses having a pulse width in the order of femtoseconds at a fixed periodicity.
[claim3]
3. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 1, characterized in that said delay time modulating circuit includes a half mirror and two sets of movable mirrors of which each set comprises mirrors fastened to a piezo stage wherein at least one of said sets of movable mirrors is adapted to be driven to change a center value of the delay time and to modulate the delay time as a center delay time with the fixed frequency.
[claim4]
4. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 1, characterized in that said lock-in detection unit is adapted to perform lock-in detection using the modulation frequency as a reference frequency and thereby to detect a quantity that is proportional to a differential coefficient of said probe signal with respect to said delay time at the center value of said delay time.
[claim5]
5. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 1, characterized in that said scanning probe microscope is a scanning tunneling microscope or an atomic force microscope.
[claim6]
6. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus, characterized in that it comprises: an ultrashort laser pulse generator;
an ultrabroadband, variable wavelength, multi-pulse waveform shaping unit for producing from an ultrashort laser pulse produced by said ultrashort laser pulse generator, a plurality of ultrashort laser pulses each of that can have different wavelength to others and interspaced by a delay time and establishing a desired value for the delay time between the ultrashort laser pulses different in wavelength;a wavelength/delay time/modulation timing control unit for producing a control signal to establish selected values for the wavelength of the ultrashort laser pulses, a control signal to establish a selected value for the delay time between the ultrashort laser pulses and a control signal to modulate the delay time at selected time instants, and delivering such control signals to a two-dimensional space amplitude modulator and a two-dimensional space phase modulator in said ultrabroadband, variable wavelength, multi-pulse waveform shaping unit while furnishing a lock-in detector with delay time modulation timing signals used as a reference signal for lock-in detection thereby;a scanning probe microscope for scanning a specimen over a surface area thereof with a probe wherein the probe is disposed just above the specimen so that a tunnel junction is formed between a probe apex and a surface of said specimen when irradiated with said ultrashort laser pulses controlled by said wavelength/delay time/modulation timing control unit and transmitted from said ultrabroadband, variable wavelength, multi-pulse waveform shaping unit;
and
a lock-in detection unit for lock-in-detecting a probe signal of the specimen irradiated with said ultrashort laser pulses in said scanning probe microscope using said modulation timing signals as the reference signal.
[claim7]
7. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 6, characterized in that said wavelength/delay time/modulation timing control unit comprises a computer that is responsive to input values for desired wavelengths of and delay time between said ultrashort laser pulses and an input value for a modulation timing frequency for computing control signals for said two-dimensional space amplitude and phase modulators and transmitting these control signals thereto while furnishing said lock-in detection unit with said modulation timing signals.
[claim8]
8. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 6, characterized in that said lock-in detection unit is configured to perform lock-in detection using said modulation timing signals as a reference frequency and thereby to detect a quantity that is proportional to a differential coefficient of said probe signal with respect to said delay time in said delay time.
[claim9]
9. A delay time modulated and femtosecond time-resolved scanning probe microscope apparatus as set forth in claim 6, characterized in that said scanning probe microscope is a scanning tunneling microscope or an atomic force microscope.
  • 発明者/出願人(英語)
  • SHIGEKAWA HIDEMI
  • TAKEUCHI OSAMU
  • YAMASHITA MIKIO
  • MORITA RYUJI
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
国際特許分類(IPC)
米国特許分類/主・副
  • 250/307
  • 250/306
  • 250/423.000F
  • 977/850
参考情報 (研究プロジェクト等) CREST Quantum Effects and Related Physical Phenomena AREA
ライセンスをご希望の方、特許の内容に興味を持たれた方は、問合せボタンを押してください。

PAGE TOP

close
close
close
close
close
close