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Time-resolved nonlinear complex sensitivity measuring apparatus

外国特許コード F110005154
整理番号 A111-29US
掲載日 2011年8月24日
出願国 アメリカ合衆国
出願番号 52814003
公報番号 20060033930
公報番号 7265848
出願日 平成15年9月19日(2003.9.19)
公報発行日 平成18年2月16日(2006.2.16)
公報発行日 平成19年9月4日(2007.9.4)
国際出願番号 JP2003012015
国際公開番号 WO2004027399
国際出願日 平成15年9月19日(2003.9.19)
国際公開日 平成16年4月1日(2004.4.1)
優先権データ
  • 特願2002-276155 (2002.9.20) JP
  • 特願2003-001549 (2003.1.7) JP
  • 2003WO-JP12015 (2003.9.19) WO
発明の名称 (英語) Time-resolved nonlinear complex sensitivity measuring apparatus
発明の概要(英語) (US7265848)
A time resolved, nonlinear complex susceptibility measuring apparatus ( 1 ) that is capable of measurement unaffected by any distortion of the wave front of a probe light whereby a temporal change in the nonlinear complex susceptibility of a nonlinear optical material that occurs when it is irradiated with a light pulse in a femtosecond range is measured using a pair of polarized lights orthogonal to each other which are formed by splitting a single light pulse into a reference and a probe light ( 5 ) and ( 6 ) in a polarized light splitting Sagnac type interference light path ( 8 ).
A direction of polarization converting mechanism for rotating a direction of polarization of the reference and probe lights by an angle of 90° in the polarized light splitting Sagnac type interference light path is included to align the directions of polarization on a test specimen ( 3 ).
A phase difference between the reference and probe lights which are output from the polarized light splitting Sagnac type interference light path is swept by a phase difference sweep mechanism ( 9 ) whereby a time resolved, nonlinear complex susceptibility is found from a phase difference sweep interference waveform obtained by measuring the intensity of interference light between the reference and probe lights for each of such phase differences swept.
特許請求の範囲(英語) [claim1]
1. A time resolved, nonlinear complex susceptibility measuring apparatus having: a Sagnac type interference light path in which a reference and a probe light to propagate, a light pulse light source for providing a light pulse with which to irradiate a test specimen disposed in the light path and for supplying the Sagnac type interference light path with a light pulse, and a measuring instrument for measuring the intensity of interference light between the reference and probe lights, characterized in that: the reference and probe lights are a pair of polarized lights orthogonal to each other, andthe Sagnac type interference light path is a polarized light splitting Sagnac type interference light path, and that the apparatus includes:a direction of polarization converting mechanism for rotating a direction of polarization of the reference and probe lights by an angle of 90 deg. in the polarized light splitting Sagnac type interference light path;
a phase difference sweep mechanism for sweeping a phase difference between the reference and probe lights that are output from the polarized light splitting Sagnac type interference light path;
and
a phase difference compensating mechanism for compensating for a phase difference between the reference and probe lights prior to entry of the light pulse into the polarized light splitting Sagnac type interference light path,whereby a phase difference between the reference and probe lights that are output from the polarized light Sagnac type interference light path is swept and a time resolved, nonlinear complex susceptibility is found from a phase difference sweep interference waveform obtained by measuring the intensity of interference light between the reference and probe lights for each of such phase differences swept.
[claim2]
2. A time resolved, nonlinear complex susceptibility measuring apparatus as set forth in claim 1, characterized in that the phase difference compensating mechanism for compensating for a phase difference between the reference and probe lights comprises a lambda /2 and a lambda /4 wavelength plate disposed between the polarized light splitting Sagnac type interference light path and the light pulse light source for supplying the light path with the light pulse whereby rotating the lambda /2 wavelength plate allows compensating for a phase difference between the reference and probe lights.
[claim3]
3. A time resolved, nonlinear complex susceptibility measuring apparatus as set forth in claim 1, characterized in that the direction of polarization converting mechanism for rotating a direction of polarization of the reference and probe lights by an angle of 90 deg. in the polarized light splitting Sagnac type interference light path comprises a lambda /2 wavelength plate disposed in the light path.
[claim4]
4. A time resolved, nonlinear complex susceptibility measuring apparatus as set forth in claim 1, characterized in that the phase difference sweep mechanism for sweeping a phase difference between the reference and probe lights that are output from the polarized light splitting Sagnac type interference light path comprises a lambda /4 wavelength plate and a light polarizer which are disposed between an output end of the polarized light splitting Sagnac type interference light path and the measuring instrument for measuring the intensity of interference light between the reference and probe lights whereby rotating the lambda /4 wavelength plate allows sweeping a phase difference between the reference and probe lights.
[claim5]
5. A time resolved, nonlinear complex susceptibility measuring apparatus as set forth in claim 1, characterized in that the phase difference sweep mechanism for sweeping a phase difference between the reference and probe lights that are output from the polarized light splitting Sagnac type interference light path comprises a lambda /4 wavelength plate and a light polarizer which are disposed between an output end of the polarized light splitting Sagnac type interference light path and the measuring instrument for measuring the intensity of interference light between the reference and probe lights whereby rotating the light polarizer allows sweeping a phase difference between the reference and probe lights.
[claim6]
6. A time resolved, nonlinear complex susceptibility measuring apparatus having: a Sagnac type interference light path in which a reference light and a probe light to propagate, a light pulse light source for providing a light pulse with which to irradiate a test specimen disposed in the light path and for supplying the Sagnac type interference light path with a light pulse, and a measuring instrument for measuring the intensity of interference light between the reference and probe lights, characterized in that: the reference and probe lights are a pair of polarized lights orthogonal to each other, andthe Sagnac type interference light path is a polarized light splitting Sagnac type interference light path, and that the apparatus includes:a direction of polarization converting mechanism for rotating a direction of polarization of the reference and probe lights by an angle of 90 deg. in the polarized light splitting Sagnac type interference light path;
a phase difference sweep mechanism for sweeping a phase difference between the reference and probe lights that are output from the polarized light splitting Sagnac type interference light path, wherein the phase difference sweep mechanism comprises a lambda /4 wavelength plate and a light polarizer which are disposed between an output end of the polarized light splitting Sagnac type interference light path and the measuring instrument for measuring the intensity of interference light between the reference and probe lights wherein rotating the light polarizer allows sweeping a phase difference between the reference and probe lights;
and
wherein a phase difference between the reference and probe lights that are output from the polarized light Sagnac type interference light path is swept and a time resolved, nonlinear complex susceptibility is found from a phase difference sweep interference waveform obtained by measuring the intensity of interference light between the reference and probe lights for each of such phase differences swept.
  • 発明者/出願人(英語)
  • MISAWA KAZUHIKO
  • INUZUKA FUMIKAZU
  • LANG HIROYOSHI
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
国際特許分類(IPC)
米国特許分類/主・副
  • 356/483
参考情報 (研究プロジェクト等) CREST Function Evolution of Materials and Devices based on Electron/Photon Related Phenomena AREA
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