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SOLAR CELL EVALUATION METHOD, EVALUATION DEVICE, MAINTENANCE METHOD, MAINTENANCE SYSTEM, AND METHOD OF MANUFACTURING SOLAR CELL MODULE 実績あり

外国特許コード F110005419
整理番号 S2009-0900-C0
掲載日 2011年9月6日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2010JP063073
国際公開番号 WO 2011/016441
国際出願日 平成22年8月3日(2010.8.3)
国際公開日 平成23年2月10日(2011.2.10)
優先権データ
  • 特願2009-181850 (2009.8.4) JP
発明の名称 (英語) SOLAR CELL EVALUATION METHOD, EVALUATION DEVICE, MAINTENANCE METHOD, MAINTENANCE SYSTEM, AND METHOD OF MANUFACTURING SOLAR CELL MODULE 実績あり
発明の概要(英語) Provided are a solar cell evaluation method and an evaluation device whereby defects of a solar cell can be easily evaluated, particularly in such a way that distinctions can be made between intrinsic defects and extrinsic defects. Also provided is the use thereof. The aforementioned solar cell evaluation device serves to make evaluations of defects in a solar cell and is provided with an electric current injection means for injecting electric current, in the forward direction, into solar cell elements constituting the aforementioned solar cell; an emitted light detection means for detecting emitted light in a first region having wave lengths of 800 nm to 1,300 nm and emitted light in a second region having wave lengths of 1,400 nm to 1,800 nm, both the aforementioned light in the first region and the light in the second region being part of the emitted light generated by solar cell elements due to electric current injected by the aforementioned electric current injection means; a determining means for making distinctions between intrinsic defects and extrinsic defects in such a way that the emission intensities of the emitted light at the aforementioned first region and the aforementioned second region detected by the aforementioned emitted light detection means are used as indices. Therefore, it is possible to easily make evaluations of defects of the solar cell.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGY
  • 発明者(英語)
  • FUYUKI, Takashi
  • TANI, Ayumi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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