TOP > 外国特許検索 > Ionization method and apparatus with probe, and analytical method and apparatus

Ionization method and apparatus with probe, and analytical method and apparatus

外国特許コード F110005749
整理番号 P08-029EP
掲載日 2011年9月13日
出願国 欧州特許庁(EPO)
出願番号 09822096
公報番号 2352022
公報番号 2352022
出願日 平成21年10月19日(2009.10.19)
公報発行日 平成23年8月3日(2011.8.3)
公報発行日 平成28年3月9日(2016.3.9)
国際出願番号 JP2009068294
国際公開番号 WO2010047399
国際出願日 平成21年10月19日(2009.10.19)
国際公開日 平成22年4月29日(2010.4.29)
優先権データ
  • 2009JP068294 (2009.10.19) WO
  • 特願2008-271954 (2008.10.22) JP
発明の名称 (英語) Ionization method and apparatus with probe, and analytical method and apparatus
発明の概要(英語) The tip of an electrically conductive probe 11 is brought into contact with a sample and captures the sample S under atmospheric pressure, a high voltage for electrospray is applied to the probe 11 while a solvent is supplied to the tip of the probe 11 that has captured the sample, and molecules of the sample S at the probe tip are ionized.
A miniscule amount of a fine solvent droplet is supplied to the probe tip and slow electrospray is implemented.
As a result, the size of the electrically charged droplet can be made extremely small and components within the sample can be analyzed extensively without selectivity.
Further, in imaging over an extended period of time, electrospray is possible even in the event that the sample dries.
特許請求の範囲(英語) [claim1]
1. An ionization method comprising: bringing the tip of an electrically conductive probe (11) into contact with a sample (S) on a stage (21) and capturing a portion of the sample (S); subsequently moving said probe (11) in a direction in which it separates from the sample (S) on said stage (21); and supplying a solvent to the tip of said probe (11) that has captured the portion of the sample (S) and separated from the sample (S) on said stage (21), and applying a high-voltage for electrospray to said probe (11), thereby ionizing molecules of the sample (S) at the tip of said probe (11), characterized in that said solvent is heated and is supplied as a vapor to the tip of said probe (11).
[claim2]
2. An ionization method according to claim 1, wherein said probe (11) is made to approach in the direction of the sample (S), said probe (11) is brought into contact with the sample surface and is made to penetrate a prescribed depth into the sample (S) where said probe (11) contacted the sample surface.
[claim3]
3. An ionization method according to claim 1 or 2, wherein the surface of said probe tip is chemically modified by molecules that capture a desired compound before the sample (S) is captured.
[claim4]
4. An ionization method according to any one of claims 1 to 3, wherein the vicinity of the tip of said probe (11) at a position separated from the sample (S) is irradiated with laser light to thereby promote ionization of the sample.
[claim5]
5. An ionization analyzing method, the method comprising the steps of: ionizing molecules by the ionization method set forth in any one of claims 1 to 4; and analyzing the ionized molecules.
[claim6]
6. An ionization apparatus comprising: a probe (11); a sample stage (21) adapted to hold a sample (S); a displacing unit (12, 22) adapted to move at least one of the probe (11) and sample stage (21) in a direction in which these approach and separate from each other; a power supply unit (41) adapted to apply a high voltage to the probe (11) at a position where at least the tip of the probe (11) is spaced away from the sample stage (21); and a solvent supply unit (31) adapted to supply a solvent to the tip of the probe (11) at a position where at least the tip of the probe (11) is spaced away from the sample stage (21), characterized in that said solvent is heated by a heating unit (34) and is supplied as a vapor to the tip of the probe (11).
[claim7]
7. An ionization apparatus according to claim 6, further comprising a contact detecting unit (45) adapted to detect that the probe tip has contacted the surface of the sample (S) on the sample stage (21);
wherein said displacing unit (12, 22) is adapted to cause the probe (11) to approach relatively in the direction of the sample stage (21) and, when the fact that the probe tip has contacted the surface of the sample (S) on the stage (21) is detected by said contact detecting unit (45), to displace the probe (11) from the detected position so as to cause the probe (11) to penetrate a prescribed depth into the sample (S).
[claim8]
8. An ionization analysis apparatus having the ionization apparatus set forth in claim 6 or 7 and an analytical apparatus (50) adapted to analyze ionized molecules.
  • 出願人(英語)
  • UNIVERSITY OF YAMANASHI
  • 発明者(英語)
  • HIRAOKA KENZO
国際特許分類(IPC)
欧州特許分類/主・副
  • H01J049/04S
  • H01J049/16E
指定国 Contracting States: AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR
上記の特許・技術に関心のある方は、下記問合せ先にご相談下さい。

PAGE TOP

close
close
close
close
close
close