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PHOTOELECTRIC CONVERSION DEVICE, LIGHT DETECTING DEVICE, AND LIGHT DETECTING METHOD

外国特許コード F110005907
整理番号 S2010-0340-C0
掲載日 2011年11月9日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2010JP065052
国際公開番号 WO 2011/027830
国際出願日 平成22年9月2日(2010.9.2)
国際公開日 平成23年3月10日(2011.3.10)
優先権データ
  • 特願2009-205959 (2009.9.7) JP
  • 特願2010-053093 (2010.3.10) JP
発明の名称 (英語) PHOTOELECTRIC CONVERSION DEVICE, LIGHT DETECTING DEVICE, AND LIGHT DETECTING METHOD
発明の概要(英語) Disclosed is a photoelectric conversion device, which can be manufactured by simple manufacturing steps, is capable of performing photoelectric conversion in a wide wavelength region, and has a high photoelectric conversion ratio also in the infrared wavelength region. A light detecting device and a light detecting method are also disclosed. The photoelectric conversion device (1) is provided with: a substrate (2) which contains a single crystalline titanium oxide; an adhering layer (2c) formed on the surface (2a) of the substrate (2); a metal fine structural bodies (3), which are disposed on the surface of the adhering layer (2c) at predetermined intervals in the predetermined direction, and each of which has a volume of 1,000-3,000,000 nm3; a container (4), which contains an electrolyte solution (L) in a region where the metal fine structural bodies (3) are disposed on the surface (2a) of the substrate (2); a conductive layer (7) formed on the rear surface (2b) of the substrate (2); and a counter electrode (5) in contact with the electrolyte solution (L) in the container (4). The metal fine structural bodies (3) are adhered on the substrate (2) with the adhering layer (2c) therebetween, and on the interface between the substrate (2) and the metal fine structural bodies (3), Schottky barriers are formed, and light in the infrared region is photoelectrically converted by means of plasmon resonance phenomenon.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National University Corporation Hokkaido University
  • 発明者(英語)
  • MISAWA Hiroaki
  • NISHIJIMA Yoshiaki
  • UENO Kosei
  • MURAKOSHI Kei
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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