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DEVICE FOR MEASURING RADIATION INTENSITY OF SMALL SEALED RADIOACTIVE SOURCE FOR CANCER THERAPY 実績あり

外国特許コード F120006156
整理番号 S2010-0193-C0
掲載日 2012年1月12日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2010JP006990
国際公開番号 WO 2011/067925
国際出願日 平成22年11月30日(2010.11.30)
国際公開日 平成23年6月9日(2011.6.9)
優先権データ
  • 特願2009-273344 (2009.12.1) JP
  • 特願2010-126136 (2010.6.1) JP
発明の名称 (英語) DEVICE FOR MEASURING RADIATION INTENSITY OF SMALL SEALED RADIOACTIVE SOURCE FOR CANCER THERAPY 実績あり
発明の概要(英語) Disclosed is a device for measuring radiation intensity of small sealed radioactive sources for cancer therapy, capable of easily and accurately measuring radiation intensity of radioactive sources while a cartridge is packed in a sterilized state. Specifically disclosed is a device for measuring radiation intensity of radioactive sources (S) filled in a cartridge (C), which comprises a radiation intensity measuring means that measures radioactive rays emitted from the radioactive sources (S); a holding means (30) that holds the cartridge (C); and a moving means that moves the holding means (30) to the radiation intensity measuring means. The moving means includes a guiding unit that guides the movement of the holding means (30) such that the holding means (30) moves along a direction orthogonal to the axial direction of a slit (15h) and a moving unit that moves the holding means (30) such that all the radioactive sources filled in the cartridge (C) passes through a position where the slit (15h) is formed inside an accommodation space of an accommodating unit.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • The University of Tokushima
  • 発明者(英語)
  • SAZE, Takuya
  • NAKAYAMA, Shintaro
  • FURUTANI, Shunsuke
  • KUWAHARA, Yoshinori
  • MORIMOTO, Tsutomu
  • KINOSHITA, Yusuke
  • KUROSAKI, Yutaka
  • YAMADA, Takaharu
  • SHINOHARA, Toshinori
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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