TOP > 外国特許検索 > METHOD FOR MEASUREMENT OF VIBRATION PROPERTY OF STRUCTURE, AND VIBRATION PROPERTY MEASUREMENT DEVICE

METHOD FOR MEASUREMENT OF VIBRATION PROPERTY OF STRUCTURE, AND VIBRATION PROPERTY MEASUREMENT DEVICE コモンズ 新技術説明会

外国特許コード F120006443
整理番号 P10-05
掲載日 2012年4月18日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP003412
国際公開番号 WO 2011/158503
国際出願日 平成23年6月15日(2011.6.15)
国際公開日 平成23年12月22日(2011.12.22)
優先権データ
  • 特願2010-136185 (2010.6.15) JP
発明の名称 (英語) METHOD FOR MEASUREMENT OF VIBRATION PROPERTY OF STRUCTURE, AND VIBRATION PROPERTY MEASUREMENT DEVICE コモンズ 新技術説明会
発明の概要(英語) A method for measuring a vibration property of a structure by applying an impulse input to the structure, which comprises: step (A) of pulse-irradiating the surface of the structure or a part adjacent to the surface with a laser beam to apply an impulse input to the structure and measuring a response output from the structure to which the impulse input has been applied; step (B) of determining the relationship between the laser intensity of the laser beam and the impulse input induced by the laser beam by a rigid pendulum method and determining an impulse input (F) corresponding to the laser intensity of the laser beam, with which the structure has been pulse-irradiated, based on the relationship; and step (C) of measuring the vibrational amplitude value of frequency response of the structure from the response output measured in step (A) and the impulse input (F) measured in step (B).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • National University Corporation Hokkaido University
  • Shibaura Institute of Technology
  • 発明者(英語)
  • KAJIWARA, Itsuro
  • HOSOYA, Naoki
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)

PAGE TOP

close
close
close
close
close
close