TOP > 外国特許検索 > RAPID METHOD FOR IDENTIFYING DRUG-RESISTANT GENE USING ARTIFICIAL CHROMOSOME OF MALARIA PARASITE, AND METHOD FOR PREPARING RECOMBINANT MALARIA PARASITE

RAPID METHOD FOR IDENTIFYING DRUG-RESISTANT GENE USING ARTIFICIAL CHROMOSOME OF MALARIA PARASITE, AND METHOD FOR PREPARING RECOMBINANT MALARIA PARASITE

外国特許コード F120006476
整理番号 S2010-0434-C0
掲載日 2012年5月7日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP001781
国際公開番号 WO 2011/118231
国際出願日 平成23年3月25日(2011.3.25)
国際公開日 平成23年9月29日(2011.9.29)
優先権データ
  • 特願2010-071688 (2010.3.26) JP
発明の名称 (英語) RAPID METHOD FOR IDENTIFYING DRUG-RESISTANT GENE USING ARTIFICIAL CHROMOSOME OF MALARIA PARASITE, AND METHOD FOR PREPARING RECOMBINANT MALARIA PARASITE
発明の概要(英語) Disclosed is a rapid method for identifying a drug-resistant gene using an artificial chromosome of a parasite. Specifically, disclosed is a method for screening for a drug-resistant gene, which involves preparing a recombinant malaria parasite using an artificial chromosome of malaria parasites, and either inoculating said recombinant malaria parasite in a non-human mammal or using the in vitro culture system of blood stage parasites in the red blood cells to obtain a survival index of the recombinant malaria parasites in the presence of a drug. Moreover, disclosed is a method for preparing a recombinant malaria parasite which involves directly introducing an exogenous gene into a malaria parasite at a high efficiency.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Mie University
  • 発明者(英語)
  • IWANAGA, Shiroh
  • YUDA, Masao
  • KANEKO, Izumi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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