TOP > 外国特許検索 > PEAK FREQUENCY MEASUREMENT SYSTEM FOR SUBJECT-STATE ANALYZING SIGNAL

PEAK FREQUENCY MEASUREMENT SYSTEM FOR SUBJECT-STATE ANALYZING SIGNAL

外国特許コード F120006507
整理番号 QP090181-PC
掲載日 2012年5月7日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP053028
国際公開番号 WO 2011/099600
国際出願日 平成23年2月14日(2011.2.14)
国際公開日 平成23年8月18日(2011.8.18)
優先権データ
  • 特願2010-030225 (2010.2.15) JP
発明の名称 (英語) PEAK FREQUENCY MEASUREMENT SYSTEM FOR SUBJECT-STATE ANALYZING SIGNAL
発明の概要(英語) A signal peak frequency measurement system which applies a maximum entropy method to the signal generated by the transmission/reception of an electromagnetic wave to/from a subject to find the frequency of a peak component to be measured, whereby desired information can be acquired with avoiding the effect of noise to properly evaluate the state of the subject. A signal analyzing means (12) executes, from a phase difference signal including noise other than the peak component to be measured, which is obtained by an electromagnetic wave transmission/reception means (11), spectrum estimation to which the maximum entropy method is applied with a signal portion having a predetermined short analysis duration of the phase difference signal as an object, finds a frequency representing the occurrence frequency of the peak component, and further repeats the same processing while moving analysis duration's worth of positions to be analyzed on the time axis of the phase difference signal, wherein, as a result of continuously conducting the frequency, the transition over the time of the frequency of the peak component can be grasped to derive the state of changes in the peak component to be measured in the phase difference signal in a short time for proper evaluation.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Kyushu University, National University Corporation
  • 発明者(英語)
  • MASE Atsushi
  • NAGAE Daisuke
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
参考情報 (研究プロジェクト等) S2011-1160-N0
上記の特許・技術に関心のある方は、下記問合せ先にご相談下さい。

PAGE TOP

close
close
close
close
close
close