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LOCALIZED CEREBRUM COOLING PROBE AND BRAIN-FUNCTION MAPPING DEVICE 新技術説明会

外国特許コード F120006514
整理番号 S2010-0601-C0
掲載日 2012年5月8日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP057424
国際公開番号 WO 2011/118802
国際出願日 平成23年3月25日(2011.3.25)
国際公開日 平成23年9月29日(2011.9.29)
優先権データ
  • 特願2010-071321 (2010.3.26) JP
発明の名称 (英語) LOCALIZED CEREBRUM COOLING PROBE AND BRAIN-FUNCTION MAPPING DEVICE 新技術説明会
発明の概要(英語) The disclosed localized cerebrum cooling probe has wiring, tubing, and a heat dissipation unit connected to a handheld module which has a Peltier device and a coolant flow section in contact with the Peltier device. A control unit circulates a coolant, runs the Peltier device, cools the tip of the handheld module in contact with a specific part of the cerebrum, and uses the response thereto to monitor the state of said part of the cerebrum. The disclosed brain-function mapping device has a mapping module comprising a plurality of cooling modules arranged in parallel, each of which has a Peltier device and a coolant flow section, like the localized cerebrum cooling probe. Wiring, tubing, and a heat dissipation unit are connected to each cooling module. A control unit selectively operates the cooling modules. The brain-function mapping device is provided with means for: taking in input data regarding the reactions that specific parts of the cerebrum exhibit upon cooling; accumulating said data; and generating mapping data. This configuration increases safety and ease of use when monitoring the states of specific parts of the cerebrum and mapping brain function.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Yamaguchi University
  • 発明者(英語)
  • FUJII, Masami
  • FUJIOKA, Hiroshi
  • SUZUKI, Michiyasu
  • SAITO, Takashi
  • KAJIWARA, Koji
  • YOSHIKAWA, Koichi
  • NOMURA, Sadahiro
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)

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