TOP > 外国特許検索 > METHOD FOR DETERMINATION OF ACTIVITY OF MITOCHONDRIAL DNA POLYMERASE OF PLASMODIUM FALCIPARUM MALARIA, AND METHOD FOR SCREENING FOR ANTI-MALARIA COMPOUND

METHOD FOR DETERMINATION OF ACTIVITY OF MITOCHONDRIAL DNA POLYMERASE OF PLASMODIUM FALCIPARUM MALARIA, AND METHOD FOR SCREENING FOR ANTI-MALARIA COMPOUND

外国特許コード F120006583
整理番号 S2010-0867
掲載日 2012年5月15日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP063965
国際公開番号 WO 2012/002180
国際出願日 平成23年6月17日(2011.6.17)
国際公開日 平成24年1月5日(2012.1.5)
優先権データ
  • 特願2010-145907 (2010.6.28) JP
発明の名称 (英語) METHOD FOR DETERMINATION OF ACTIVITY OF MITOCHONDRIAL DNA POLYMERASE OF PLASMODIUM FALCIPARUM MALARIA, AND METHOD FOR SCREENING FOR ANTI-MALARIA COMPOUND
発明の概要(英語) Disclosed is a means which is useful for the development of an anti-malaria agent. It is found that a mitochondrial DNA polymerase of plasmodium falciparum malaria requires a bivalent iron ion. Thus, disclosed is a method for determining the activity of a DNA polymerase, comprising the steps of: (1) incubating a solution containing a bivalent iron ion, a mitochondrial DNA polymerase of plasmodium falciparum malaria, template DNA, and at least one deoxyribonucleoside triphosphate or deoxyribonucleoside triphosphate derivative to synthesize double-stranded DNA; (2) detecting the synthesized double-stranded DNA; and (3) calculating the activity of the DNA polymerase from the results of the detection carried out in step (2).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
  • OCHANOMIZU UNIVERSITY
  • 発明者(英語)
  • SASAKI Narie
  • MUROFUSHI Kimiko
  • MAEDA Katsura
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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