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LEAKAGE INSPECTION DEVICE AND LEAKAGE INSPECTION METHOD

外国特許コード F120006626
整理番号 S2010-0958
掲載日 2012年5月17日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP065222
国際公開番号 WO 2012/005199
国際出願日 平成23年7月1日(2011.7.1)
国際公開日 平成24年1月12日(2012.1.12)
優先権データ
  • 特願2010-153217 (2010.7.5) JP
発明の名称 (英語) LEAKAGE INSPECTION DEVICE AND LEAKAGE INSPECTION METHOD
発明の概要(英語) Provided are a leakage inspection device and a leakage inspection method for inspecting the flow rate of leakage from a tested body disposed in a tested-body chamber (21). The leakage inspection device comprises a liquid supplying and pressurizing means (11) for supplying a probe liquid to the inside of the tested-body chamber (21) and pressurizing the probe liquid to a high pressure of 0.1 MPa or more, a vacuum exhausting means (22-b, 23-b), and a quadrupole mass spectrometer (34). The tested-body chamber (21) is evacuated, a probe liquid is supplied to the inside of the tested body and is pressurized to a pressure of 0.1 MPa or more, and the concentration of a probe medium leaking from the tested body and evaporating in a vacuum is measured by the quadrupole mass spectrometer (34), thereby measuring the flow rate of leakage from the tested body. It is possible to determine the flow rate of leakage using a liquid as a probe medium and simultaneously it is possible to perform a withstanding pressure test especially at high pressures ranging from 1 MPa up to 1 GPa under an atmospheric pressure of 0.1 MPa or more.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Yamaguchi University
  • Marunaka Co., Ltd.
  • 発明者(英語)
  • YAMAMOTO, Setsuo
  • KURISU, Hiroki
  • TAKADA, Naoki
  • NAKAGAWA, Mitsugu
  • TSUGE, Katsushi
  • ISHIKAWA Yukihiro
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)

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