TOP > 外国特許検索 > CONTACT STATE DETECTION DEVICE, CONTACT STATE DETECTION METHOD, COMPUTER PROGRAM FOR CONTACT STATE DETECTION, ELECTRICAL CONDUCTIVITY MEASUREMENT SYSTEM PROVIDED WITH CONTACT STATE DETECTION DEVICE, AND ELECTRICAL CONDUCTIVITY MEASUREMENT METHOD INVOLVING CONTACT STATE DETECTION METHOD

CONTACT STATE DETECTION DEVICE, CONTACT STATE DETECTION METHOD, COMPUTER PROGRAM FOR CONTACT STATE DETECTION, ELECTRICAL CONDUCTIVITY MEASUREMENT SYSTEM PROVIDED WITH CONTACT STATE DETECTION DEVICE, AND ELECTRICAL CONDUCTIVITY MEASUREMENT METHOD INVOLVING CONTACT STATE DETECTION METHOD

外国特許コード F120006631
整理番号 S2010-1001
掲載日 2012年5月17日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP065959
国際公開番号 WO 2012/008484
国際出願日 平成23年7月13日(2011.7.13)
国際公開日 平成24年1月19日(2012.1.19)
優先権データ
  • 特願2010-159971 (2010.7.14) JP
発明の名称 (英語) CONTACT STATE DETECTION DEVICE, CONTACT STATE DETECTION METHOD, COMPUTER PROGRAM FOR CONTACT STATE DETECTION, ELECTRICAL CONDUCTIVITY MEASUREMENT SYSTEM PROVIDED WITH CONTACT STATE DETECTION DEVICE, AND ELECTRICAL CONDUCTIVITY MEASUREMENT METHOD INVOLVING CONTACT STATE DETECTION METHOD
発明の概要(英語) Disclosed are a contact state detection device with a simple structure capable of accurately detecting, without damaging a contact body (such as a probe) or a contacted body, the pressing state of the contact body pressing on the contacted body; also disclosed is an electrical conductivity measurement system provided with the contact state detection device. The contact detection device suitable for an electrical conductivity measurement system (100) is provided with a contact body approach unit (123), a probe light source (131), an imaging element (135), and a computer device (140). The contact body approach unit (123) is displaced towards the contacted body (WK) while holding the contact body (110) oriented so as to intersect the contacted surface of the contacted body (WK). The probe light source (131) irradiates light towards the contact body (110) which is displaced towards the contacted body (WK). The imaging element (135) images the illuminated contact body (110) and outputs to the computer device (140) contact body captured image information. The computer device (140) detects the pressing state of the contact body (110) pressing on the contacted body (WK) on the basis of changes in the contact body captured image information.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
  • 発明者(英語)
  • Iwata Futoshi
  • Shiomi Toshio
  • Suzuki Koji
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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