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DEVICE FOR MEASURING IN-LIQUID ELECTRIC POTENTIAL, AND ATOMIC FORCE MICROSCOPE

外国特許コード F120006657
整理番号 S2011-0095
掲載日 2012年5月22日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP004325
国際公開番号 WO 2012/060033
国際出願日 平成23年7月29日(2011.7.29)
国際公開日 平成24年5月10日(2012.5.10)
優先権データ
  • 特願2010-248744 (2010.11.5) JP
発明の名称 (英語) DEVICE FOR MEASURING IN-LIQUID ELECTRIC POTENTIAL, AND ATOMIC FORCE MICROSCOPE
発明の概要(英語) In order to provide a device for measuring in-liquid electric potential that can measure surface potential in a liquid, this device (200) for measuring in-liquid electric potential is provided with: a cantilever (204) provided with a probe at the free end; a displacement measurement unit (206) that outputs a voltage that is mapped to a displacement of the end of the cantilever (204); an alternating current power source (201) that applies an alternating current voltage between the probe and a sample; and a signal detection unit (207). The frequency of the alternating current voltage outputted from the alternating current power source is at least 10 kHz. Of the voltages output by the displacement measurement unit, the signal detection unit outputs: the size of the frequency component that has the same frequency as the frequency of the alternating current voltage that the alternating current power source outputs; the size of the frequency component that has a frequency that is double that of the alternating current voltage that the alternating current power source outputs; and a frequency component that is included in the voltage output by the displacement measurement unit and that is a component that has the same phase as the alternating current voltage that the alternating current power source outputs from among the frequency components having the same frequency as the frequency of the alternating current voltage that the alternating current power source outputs.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
  • 発明者(英語)
  • FUKUMA, Takeshi
  • KOBAYASHI, Naritaka
  • ASAKAWA, Hitoshi
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
(有)金沢大学ティ・エル・オーは、金沢大学の研究者の出願特許を産業界へ技術移転することを主目的として、金沢大学の教官の出資により設立された技術移転機関です。
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