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PRETREATMENT DEVICE FOR ANALYSIS OF DISSOLVED ION, DISSOLVED ION ANALYSIS SYSTEM, AND PRETREATMENT METHOD FOR ANALYSIS OF DISSOLVED ION 新技術説明会

外国特許コード F120006777
整理番号 S2011-0081
掲載日 2012年6月20日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP069567
国際公開番号 WO 2012/073566
国際出願日 平成23年8月30日(2011.8.30)
国際公開日 平成24年6月7日(2012.6.7)
優先権データ
  • 特願2010-268404 (2010.12.1) JP
発明の名称 (英語) PRETREATMENT DEVICE FOR ANALYSIS OF DISSOLVED ION, DISSOLVED ION ANALYSIS SYSTEM, AND PRETREATMENT METHOD FOR ANALYSIS OF DISSOLVED ION 新技術説明会
発明の概要(英語) Provided is a pretreatment device for use in the analysis of a dissolved ion, which enables the separation of a dissolved ion to be analyzed from a sample solution within a short time and which is applicable to both a case in which the dissolved ion to be measured is a cation and a case in which the dissolved ion to be measured is an anion. A pretreatment device (10) for use in the analysis of a dissolved ion, which comprises: a sample solution flow path (11) through which a sample solution containing the dissolved ion to be measured flows; an extracted solution flow path (13) which is arranged adjacent to the sample solution flow path (11) so as to intercalate a dialysis membrane (12) between the extracted solution flow path (13) and the sample solution flow path (11); a pair of electrodes (14a, 14b) which are so arranged as to intercalate the sample solution flow path (11) and the extracted solution flow path (13) therebetween; and a direct current power source (5) which enables the generation of a predetermined potential difference between the electrodes (14a, 14b). When the pretreatment device (10) is used, it becomes possible to separate a dissolved ion to be analyzed from a sample solution within a short time, and the device (10) is effective for a pretreatment in the analysis of an ion, such as an ion chromatography method, an ICP emission spectrometry method, an atomic absorption spectrometry method and a mass spectrometry method.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION KUMAMOTO UNIVERSITY
  • 発明者(英語)
  • OHIRA, Shinichi
  • TODA, Kei
  • DASGUPTA, PURNENDU K.
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL CERTIFICATE),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),QA,RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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