TOP > 外国特許検索 > DEPENDABILITY MAINTENANCE DEVICE, DEPENDABILITY MAINTENANCE SYSTEM, MALFUNCTION SUPPORTING SYSTEM, METHOD FOR CONTROLLING DEPENDABILITY MAINTENANCE DEVICE, CONTROL PROGRAM, COMPUTER READABLE RECORDING MEDIUM RECORDING CONTROL PROGRAM

DEPENDABILITY MAINTENANCE DEVICE, DEPENDABILITY MAINTENANCE SYSTEM, MALFUNCTION SUPPORTING SYSTEM, METHOD FOR CONTROLLING DEPENDABILITY MAINTENANCE DEVICE, CONTROL PROGRAM, COMPUTER READABLE RECORDING MEDIUM RECORDING CONTROL PROGRAM

外国特許コード F120006778
整理番号 AF10-01WO
掲載日 2012年6月20日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP076219
国際公開番号 WO 2012/073686
国際出願日 平成23年11月14日(2011.11.14)
国際公開日 平成24年6月7日(2012.6.7)
優先権データ
  • 特願2010-267461 (2010.11.30) JP
  • 特願2011-177322 (2011.8.12) JP
発明の名称 (英語) DEPENDABILITY MAINTENANCE DEVICE, DEPENDABILITY MAINTENANCE SYSTEM, MALFUNCTION SUPPORTING SYSTEM, METHOD FOR CONTROLLING DEPENDABILITY MAINTENANCE DEVICE, CONTROL PROGRAM, COMPUTER READABLE RECORDING MEDIUM RECORDING CONTROL PROGRAM
発明の概要(英語) This workspace computer (101) and/or runtime computer (102) obtains a D value which indicates a quantitative value of the dependability of a target system, on the basis of dependability descriptive data in which requirement/specification relating to the dependability of the target system is described.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • YOKOTE, Yasuhiko
  • TOKORO, Mario
  • YAMAMOTO, Shuichiroh
  • MATSUNO, Yutaka
国際特許分類(IPC)
指定国 AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL CERTIFICATE),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),QA,RO,RS(PETTY PATENT),RU(UTILITY MODEL),RW(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),RW(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
参考情報 (研究プロジェクト等) CREST Dependable Operating Systems for Embedded Systems Aiming at Practical Applications AREA
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