TOP > 外国特許検索 > METHOD FOR TESTING FOR PSYCHIATRIC DISORDER, TEST KIT FOR PSYCHIATRIC DISORDER, AND METHOD FOR EVALUATING THERAPEUTIC AGENT AND/OR PREVENTION AGENT FOR PSYCHIATRIC DISORDER

METHOD FOR TESTING FOR PSYCHIATRIC DISORDER, TEST KIT FOR PSYCHIATRIC DISORDER, AND METHOD FOR EVALUATING THERAPEUTIC AGENT AND/OR PREVENTION AGENT FOR PSYCHIATRIC DISORDER 新技術説明会

外国特許コード F120006860
整理番号 S2010-1052-C0
掲載日 2012年9月20日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP067004
国際公開番号 WO 2012/017867
国際出願日 平成23年7月26日(2011.7.26)
国際公開日 平成24年2月9日(2012.2.9)
優先権データ
  • 特願2010-175748 (2010.8.4) JP
発明の名称 (英語) METHOD FOR TESTING FOR PSYCHIATRIC DISORDER, TEST KIT FOR PSYCHIATRIC DISORDER, AND METHOD FOR EVALUATING THERAPEUTIC AGENT AND/OR PREVENTION AGENT FOR PSYCHIATRIC DISORDER 新技術説明会
発明の概要(英語)

Provided are: a method for testing for a psychiatric disorder by means of an objective determination standard based on a biological indicator through a technique that has a single gene as a subject

an test kit for a psychiatric disorder

and a method for evaluating a therapeutic agent and/or prevention agent for a psychiatric disorder. This method for testing for a psychiatric disorder includes: a detection step for detecting the methylation state at a CpG island upstream from an exon I of the BDNF gene in a sample collected from a subject

and an testing step for comparing the methylation state of the sample and the methylation state of the CpG island upstream from the exon I of the BDNF gene in a sample collected from an individual with the psychiatric disorder and an individual without the psychiatric disorder, thus testing whether or not the subject has the psychiatric disorder. Preferably, the psychiatric disorder is depression and/or schizophrenia.

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • HIROSHIMA UNIVERSITY,
  • MORINOBU SHIGERU,
  • FUCHIKAMI MANABU
  • 発明者(英語)
  • MORINOBU SHIGERU,
  • FUCHIKAMI MANABU
国際特許分類(IPC)

PAGE TOP

close
close
close
close
close
close