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DELAY TIME MODULATION FEMTOSECOND TIME-RESOLVED SCANNING PROBE MICROSCOPE APPARATUS

外国特許コード F040000694
整理番号 F040000694
掲載日 2005年2月22日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2002JP012273
国際公開番号 WO 2003/046519
国際出願日 平成14年11月25日(2002.11.25)
国際公開日 平成15年6月5日(2003.6.5)
優先権データ
  • 特願2001-360047 (2001.11.26) JP
発明の名称 (英語) DELAY TIME MODULATION FEMTOSECOND TIME-RESOLVED SCANNING PROBE MICROSCOPE APPARATUS
発明の概要(英語) An apparatus for measuring a physical phenomenon caused by light excitation having an extreme resolution in both time and space domains, particularly a delay time modulation time-resolved probe scanning microscope. The apparatus comprises an ultra-short light laser pulse generator (2), a delay modulation circuit (6) for splitting an ultra-short light laser pulse (3) generated by the ultra-short light laser pulse generator (2) into two pulses and frequency-modulating (omega) the delay time td between the two ultra-short light laser pulses (4, 5), a scanning probe microscope (17), and a lock-in detector (8) for detecting lock-in of a probe signal of the microscope (17) with a modulation frequency (omega) of the delay time. The delay-time dependence of the probe signal (11) on the delay time is determined as a change of rate without being influenced by the fluctuation of the intensity of the ultra-short light laser pulse (3) and without thermal expansion and thermal contraction of the chip of the probe (19) caused by the application of the ultra-short light laser pulse (3). With a femtosecond-order time resolution and an angstrom-order space resolution, a light excitation physical phenomenon depending on the delay time between ultra-short light pulses can be measured.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • Japan Science And Technology Corporation
  • 発明者(英語)
  • Shigekawa, Hidemi
  • Takeuchi, Osamu
  • Yamashita, Mikio
  • Morita, Ryuji
国際特許分類(IPC)
指定国 JP US AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LU MC NL PT SE SK TR
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