TOP > 外国特許検索 > MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION METHOD

MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION METHOD

外国特許コード F120006988
整理番号 S2010-1159-C0
掲載日 2012年10月29日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2011JP070146
国際公開番号 WO 2012/029973
国際出願日 平成23年9月5日(2011.9.5)
国際公開日 平成24年3月8日(2012.3.8)
優先権データ
  • 特願2010-198054 (2010.9.3) JP
発明の名称 (英語) MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION METHOD
発明の概要(英語)

Disclosed are a magnetic field observation device and magnetic field observation method capable of measuring the magnetic force with high resolution near the surface of a magnetic sample, and capable of polarity detection of the magnetic poles on the surface of said magnetic sample. The disclosed magnetic field observation device is provided with a probe, an excitation mechanism for exciting the probe, a scanning mechanism for producing relative displacement of the probe and the magnetic sample, an alternating magnetic field generation mechanism which can periodically reverse magnetization of the probe and which applies to the probe an alternating magnetic field of a magnitude that does not reverse magnetization of the magnetic sample, and a modulation measurement mechanism capable of detecting, by measuring the intensity of one of the spectral sidebands generated by frequency demodulation or frequency modulation, the degree of periodic frequency modulation of probe oscillation caused by the apparent spring constant of the probe which changes periodically depending on the force which, changing periodically in intensity, is applied to the probe by the alternating force from the magnetic interaction between the magnetization of the probe and the magnetization of the magnetic sample

the disclosed magnetic field observation method is performed using said magnetic field observation device.

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • AKITA UNIVERSITY,
  • SAITO, HITOSHI,
  • YOSHIMURA, SATORU
  • 発明者(英語)
  • SAITO, HITOSHI,
  • YOSHIMURA, SATORU
国際特許分類(IPC)
ライセンスをご希望の方、特許の内容に興味を持たれた方は、下記「問合せ先」まで直接お問い合わせください。

PAGE TOP

close
close
close
close
close
close