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OPTICAL CHARACTERISTICS MEASURING APPARATUS, AND OPTICAL CHARACTERISTICS MEASURING METHOD

外国特許コード F130007111
整理番号 S2011-0347-C0
掲載日 2013年1月11日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2012JP054940
国際公開番号 WO 2012/118079
国際出願日 平成24年2月28日(2012.2.28)
国際公開日 平成24年9月7日(2012.9.7)
優先権データ
  • 特願2011-043170 (2011.2.28) JP
発明の名称 (英語) OPTICAL CHARACTERISTICS MEASURING APPARATUS, AND OPTICAL CHARACTERISTICS MEASURING METHOD
発明の概要(英語)

Linearly-polarized light reaching a sample (S) via a polarizer is provided with retardation by the sample (S), and then reaches a movable mirror portion (131) and a fixed mirror portion (132) of a phase shifter (13) via a first polarizing plate (9) and a second polarizing plate (11). Measurement light reflected by these mirror portions is passed through an analyzer (15) and an imaging lens (17) by which an interference image is formed on a light-reception surface of a detector (19). At this time, by moving the movable mirror portion (131), an optical path length difference between a light flux reflected by the movable mirror portion (131) and a light flux reflected by the fixed mirror portion (132) can be continuously varied. As a result, the imaging intensity of the interference image detected by the detector (19) is continuously varied, and a composed waveform similar to an interferogram can be acquired. Subjecting the composed waveform to Fourier transform yields amplitude on a wavelength basis and a birefringent phase difference on a wavelength basis.

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY,
  • ISHIMARU, ICHIRO
  • 発明者(英語)
  • ISHIMARU, ICHIRO
国際特許分類(IPC)

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