TOP > 外国特許検索 > POTENTIAL OBTAINING APPARATUS, MAGNETIC FIELD MICROSCOPE, INSPECTION APPARATUS, AND POTENTIAL OBTAINING METHOD

POTENTIAL OBTAINING APPARATUS, MAGNETIC FIELD MICROSCOPE, INSPECTION APPARATUS, AND POTENTIAL OBTAINING METHOD コモンズ

外国特許コード F130007283
整理番号 KP09-052PCT-US
掲載日 2013年4月9日
出願国 アメリカ合衆国
出願番号 201113582151
公報番号 20120330581
出願日 平成23年3月1日(2011.3.1)
公報発行日 平成24年12月27日(2012.12.27)
国際出願番号 WO2011JP54635
国際出願日 平成23年3月1日(2011.3.1)
優先権データ
  • 特願2010-044218 (2010.3.1) JP
発明の名称 (英語) POTENTIAL OBTAINING APPARATUS, MAGNETIC FIELD MICROSCOPE, INSPECTION APPARATUS, AND POTENTIAL OBTAINING METHOD コモンズ
発明の概要(英語)

In a magnetic field obtaining apparatus, a measuring part (21) that is sufficiently longer than the width of an area to be measured is disposed on a measurement plane that satisfies z=[alpha], and scanning in an X' direction perpendicular to the longitudinal direction of the measuring part (21) is repeated while changing an angle [theta] formed by a predetermined reference direction on the measurement plane and the longitudinal direction of the measuring part (21) to a plurality of angles. Assuming that x' is a coordinate parameter in the X' direction, measured values f(x', [theta]) obtained by repetitions of the scanning are Fourier transformed so as to obtain g(kx', [theta]) (where kx' is a wavenumber in the X' direction). Then, g(kx', [theta]) is substituted into a predetermined two-dimensional potential obtaining equation so as to obtain [phi](x, y, [alpha]) that indicates a two-dimensional potential on the measurement plane. Accordingly, it is possible to perform high-resolution two-dimensional potential measurement as a result of using the measuring part (21) that is sufficiently larger than the width of an area to be measured.

  • 発明者/出願人(英語)
  • KIMURA KENJIRO
  • 国立大学法人神戸大学
国際特許分類(IPC)
神戸大学連携創造本部では、神戸大学で創出された知的財産の管理,活用等を行っています。上記の公開特許に関心のある方は、下記「問合せ先」まで直接お問い合わせ下さい。

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